DOIAbstract
Analysis shows that acoustic imaging based on the detection of ultrasonic fields using a modified atomic force microscope operated in the near-field mode not only offers nanoscale resolution but also opens the way forward to elastic imaging
Analysis shows that acoustic imaging based on the detection of ultrasonic fields using a modified atomic force microscope operated in the near-field mode not only offers nanoscale resolution but also opens the way forward to elastic imaging
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Acoustic waves can penetrate into materials, and thus it is possible to study the microstructure of ...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
We present a new type of near-field Acoustic Microscopy combining Atomic Force Microscopy (AFM) and ...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
The development of acoustic subsurface atomic force microscopy, which promises three-dimensional ima...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
Acoustic microscopy not only allows imaging of sample surfaces with high spatial resolution but also...
Acoustic microscopy enables you to image and measure the elastic properties of materials with the re...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Elastic properties of nanoscopic materials, structures and thin films are important parameters contr...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Over the past few years, sub-surface imaging techniques at the nano-scale have become increasingly i...
Acoustic microscopy enables one to image the interaction of acoustic waves with the elastic properti...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Acoustic waves can penetrate into materials, and thus it is possible to study the microstructure of ...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
We present a new type of near-field Acoustic Microscopy combining Atomic Force Microscopy (AFM) and ...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
The development of acoustic subsurface atomic force microscopy, which promises three-dimensional ima...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
Acoustic microscopy not only allows imaging of sample surfaces with high spatial resolution but also...
Acoustic microscopy enables you to image and measure the elastic properties of materials with the re...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Elastic properties of nanoscopic materials, structures and thin films are important parameters contr...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Over the past few years, sub-surface imaging techniques at the nano-scale have become increasingly i...
Acoustic microscopy enables one to image the interaction of acoustic waves with the elastic properti...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Acoustic waves can penetrate into materials, and thus it is possible to study the microstructure of ...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
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