Work on reliability and life time estimation of new electronic components is an initial approach to find a solution for estimating the remaining life time of such components. A basis for this work is the soldered joint, because its fatigue is one of the main reasons for the failure of electronic circuits under normal operating conditions. In case of the remaining life time estimation, a statement for a single component has to be made which is submitted under unknown operating conditions during its life. In order to transfer the existing results of reliability and life time estimation of new electronic components, this problem has to be solved. The following issues are investigated: the state of the art in life cycle assessment research for ...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
The electronics market is characterized by short innovation cycles. It is becoming increasingly diff...
Strategies for reuse of components are important in order to create a closed loop manufacturing syst...
A state-of-the-art prediction of the remaining life of a product is discussed in detail in this pape...
Remaining life assessment is the process of predicting the future operational life of a product, bas...
Abstract-Life consumption monitoring is a prognostic method to assess the remaining life of a produc...
The key factor for competitiveness, in all industrial sectors, is to continuously enhance the qualit...
Information on product use conditions is essential for sound strategies of product service as well a...
Many electronic systems, such as computers and telephones, have a short service life, typically betw...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...
To meet the specifications of low cost, highly reliable electronic devices, fault diagnosis techniqu...
This paper presents a two-stage integrated approach to assess the reliability of components for reus...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
The electronics market is characterized by short innovation cycles. It is becoming increasingly diff...
Strategies for reuse of components are important in order to create a closed loop manufacturing syst...
A state-of-the-art prediction of the remaining life of a product is discussed in detail in this pape...
Remaining life assessment is the process of predicting the future operational life of a product, bas...
Abstract-Life consumption monitoring is a prognostic method to assess the remaining life of a produc...
The key factor for competitiveness, in all industrial sectors, is to continuously enhance the qualit...
Information on product use conditions is essential for sound strategies of product service as well a...
Many electronic systems, such as computers and telephones, have a short service life, typically betw...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...
To meet the specifications of low cost, highly reliable electronic devices, fault diagnosis techniqu...
This paper presents a two-stage integrated approach to assess the reliability of components for reus...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...
Assessing the condition of a device includes receiving signals from a sensor that makes electrical m...