The invention relates to a device for recognizing defects in the surface or inside transparent objects or on reflecting objects or their inside if the reflecting surface is facing away from the direction of observation, said invention resulting from the production of an image by means of a device to illuminate the object on the same side of the object, whereby the light source 1 is generated to illuminate the object by means of a partially reflecting plane surface 2 and a retroreflecting surface 4 of any shape, whereby the use of telecentric or approximately telecentric optics for illumination and projection leads to the defined projection of the object and an automatically acting device for the recognition of defects
The device has a light source that illuminates an objective plane in one or two dimensionally over t...
DE 19822392 A UPAB: 20000124 NOVELTY - The method involves indicating the defect point (5) with an o...
This paper describes a novel approach for inspecting transparent objects. Since the underlying optic...
The invention relates to a device and to a method for detecting at least partially reflective surfac...
EP 1837623 A1 UPAB: 20071031 NOVELTY - The method involves forming a light pattern over a surface th...
The appliance has a number of light sources (8,9) generating a light beam directed on to the surface...
EP 898163 A UPAB: 19990324 NOVELTY - Illumination and observation channels are formed by light sensi...
The description relates to a device for the topographical inspection of the surfaces of an object to...
This work aims at detecting surface defects on reflecting industrial parts. A machine vision system,...
The invention relates to a device for spatially measuring surfaces, comprising a projector (2) for p...
EP 1201872 A UPAB: 20020730 NOVELTY - The device has a translucent optical element(s) with a flat in...
An apparatus (1) for illuminating items comprises a the imaging device (2) for capturing an image of...
The hole (2) or the part transparent surface, through which the optic of the detector can so enter o...
This paper presents an automated defect detection system for coated plastic components for the autom...
Machine vision methods are widely and successfully used for assuring the quality of any produced goo...
The device has a light source that illuminates an objective plane in one or two dimensionally over t...
DE 19822392 A UPAB: 20000124 NOVELTY - The method involves indicating the defect point (5) with an o...
This paper describes a novel approach for inspecting transparent objects. Since the underlying optic...
The invention relates to a device and to a method for detecting at least partially reflective surfac...
EP 1837623 A1 UPAB: 20071031 NOVELTY - The method involves forming a light pattern over a surface th...
The appliance has a number of light sources (8,9) generating a light beam directed on to the surface...
EP 898163 A UPAB: 19990324 NOVELTY - Illumination and observation channels are formed by light sensi...
The description relates to a device for the topographical inspection of the surfaces of an object to...
This work aims at detecting surface defects on reflecting industrial parts. A machine vision system,...
The invention relates to a device for spatially measuring surfaces, comprising a projector (2) for p...
EP 1201872 A UPAB: 20020730 NOVELTY - The device has a translucent optical element(s) with a flat in...
An apparatus (1) for illuminating items comprises a the imaging device (2) for capturing an image of...
The hole (2) or the part transparent surface, through which the optic of the detector can so enter o...
This paper presents an automated defect detection system for coated plastic components for the autom...
Machine vision methods are widely and successfully used for assuring the quality of any produced goo...
The device has a light source that illuminates an objective plane in one or two dimensionally over t...
DE 19822392 A UPAB: 20000124 NOVELTY - The method involves indicating the defect point (5) with an o...
This paper describes a novel approach for inspecting transparent objects. Since the underlying optic...