Add to ORKGThe combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe echniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral atomic force acoustic microscopy are techniques which use the vibration modes of AFM cantilevers. In the AFAM-mode the cantilever is vibrating in one of its flexural resonances while the sensor tip is continuously in contact with the sample surface. With this imaging technique a contrast can be obtained which depends on the elasticity of the sample surface. Quantitative values of a local elastic constant can be obtained. Shear stiffness and friction phenomena can be investigated in ultrasonic friction force microscopy by evaluating the torsional res...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
Using scanning probe techniques, surface properties such as shear stiffness and friction can be meas...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing on...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
We have modified and Atomic Force Microscope (AFM) that allow the detection of cantilever bending as...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
Using scanning probe techniques, surface properties such as shear stiffness and friction can be meas...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing on...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
We have modified and Atomic Force Microscope (AFM) that allow the detection of cantilever bending as...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
Using scanning probe techniques, surface properties such as shear stiffness and friction can be meas...
The increasing production of nano-devices and nano-composite materials has prompted the development ...