Back-illuminated full body glass tips coated with a thin metal layer can be used as local probes for apertureless scanning near-field optical microscopy (SNOM). In order to achieve high spatial resolution, high electric field intensities and low background illumination, the thickness of the metal coating, angular illumination direction, and polarization have to be optimized. Optimal conditions have been calculated and experimentally verified for 10-15 nm thick aluminium and 15-25 nm thick silver layers. Upon imaging single dye molecules, characteristic single and double-peak patterns with peak widths down to 15 nm could be measured, exhibiting an optical resolution which exceeds the classical diffraction limit of Abbe significantly
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
Aperture probes of scanning near-field optical microscopes (SNOM) offer resolution which is limited ...
Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and s...
We show improvement of the optical and topographical resolution of scanning near-field optical micro...
Apertureless scanning near-field optical microscopy is a valuable tool for characterization of chemi...
Scanning near-field optical microscopy (SNOM) aims at imaging nanostructured samples with sub-wavele...
We show that lateral resolution well beyond 100 nm can be obtained in scanning near-field optical mi...
Scanning Near-field Optical Microscopy (SNOM) is the leading instrument used to image optical field...
A systematic study of the influence of the excitation angle, the light polarization and the coating ...
Many areas of cell biology have remained unexplored due to the limitations of conventional optical m...
Two methodologies, aimed at increasing the sensitivity and resolution of near-field scanning optical...
We discuss the theoretical and experimental considerations of performing scanning near-field optical...
Two methodologies, aimed at increasing the sensitivity and resolution of near-field scanning optical...
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
Aperture probes of scanning near-field optical microscopes (SNOM) offer resolution which is limited ...
Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and s...
We show improvement of the optical and topographical resolution of scanning near-field optical micro...
Apertureless scanning near-field optical microscopy is a valuable tool for characterization of chemi...
Scanning near-field optical microscopy (SNOM) aims at imaging nanostructured samples with sub-wavele...
We show that lateral resolution well beyond 100 nm can be obtained in scanning near-field optical mi...
Scanning Near-field Optical Microscopy (SNOM) is the leading instrument used to image optical field...
A systematic study of the influence of the excitation angle, the light polarization and the coating ...
Many areas of cell biology have remained unexplored due to the limitations of conventional optical m...
Two methodologies, aimed at increasing the sensitivity and resolution of near-field scanning optical...
We discuss the theoretical and experimental considerations of performing scanning near-field optical...
Two methodologies, aimed at increasing the sensitivity and resolution of near-field scanning optical...
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
This chapter reports a broad overview of near-field optical probes. They represent the key componen...
Aperture probes of scanning near-field optical microscopes (SNOM) offer resolution which is limited ...
Wehave developed aneweasy-to-use probe that can be used to combine atomic force microscopy(AFM)and s...