DE 102008052223 A1 UPAB: 20100506 NOVELTY - The scanner (1) has a single-line lighting unit for excitation of luminescence in a semiconductor device. A detector (4) i.e. indium gallium arsenide charge coupled device (CCD) camera, is provided for spatially resolved detection of luminescence emitted by a semiconductor component. An analyzing unit i.e. electronic computing unit, determines physical properties of the semiconductor component from the detected spatially resolved luminescence. A lighting unit (3a) illuminates the semiconductor device with light. DETAILED DESCRIPTION - An INDEPENDENT CLAIM is also included for a method for detecting physical characteristics of a semiconductor component by a luminescence scanner. USE - Luminescence ...
DE 10223201 C UPAB: 20030619 NOVELTY - The device has a primary detection diode (25) and an array of...
DE 102009042990 A1 UPAB: 20110509 NOVELTY - The module has a laminar substrate made of light-conduct...
For inline control of the material quality, a non-destructive, non-contact, non-preparational as wel...
La lumière généré à l'intérieur d'un composant de silicium donne à la même fois des informations sur...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX79368 / BLDSC - British Library Do...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
DE 102009019940 A1 UPAB: 20101130 NOVELTY - The collector has photonic structures (2, 2') in an emis...
DE 102009021799 A1 UPAB: 20101203 NOVELTY - The method involves generating a luminescence radiation ...
The research described in this dissertation is the first evaluation and application of a new class o...
The invention involves a measuring method for a semiconductor structure with a front side and a back...
This diploma thesis deals with noncontact temperature measurement using luminescent materials. In th...
Low light level imaging devices have the advantage that they can produce quantitative two dimensiona...
DE 10223201 C UPAB: 20030619 NOVELTY - The device has a primary detection diode (25) and an array of...
DE 102009042990 A1 UPAB: 20110509 NOVELTY - The module has a laminar substrate made of light-conduct...
For inline control of the material quality, a non-destructive, non-contact, non-preparational as wel...
La lumière généré à l'intérieur d'un composant de silicium donne à la même fois des informations sur...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX79368 / BLDSC - British Library Do...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
This paper describes the methodology developed for characterizing a commercial charge-coupled device...
DE 102009019940 A1 UPAB: 20101130 NOVELTY - The collector has photonic structures (2, 2') in an emis...
DE 102009021799 A1 UPAB: 20101203 NOVELTY - The method involves generating a luminescence radiation ...
The research described in this dissertation is the first evaluation and application of a new class o...
The invention involves a measuring method for a semiconductor structure with a front side and a back...
This diploma thesis deals with noncontact temperature measurement using luminescent materials. In th...
Low light level imaging devices have the advantage that they can produce quantitative two dimensiona...
DE 10223201 C UPAB: 20030619 NOVELTY - The device has a primary detection diode (25) and an array of...
DE 102009042990 A1 UPAB: 20110509 NOVELTY - The module has a laminar substrate made of light-conduct...
For inline control of the material quality, a non-destructive, non-contact, non-preparational as wel...