This work presents a model to assess the loss mechanisms of back-contact back-junction (BC-BJ) silicon solar cells fabricated at Fraunhofer ISE. It describes the three main loss mechanisms in our BC-BJ solar cells: the series resistance, the optical losses and the recombination losses and their influence on the cell efficiency. The several calculations are based on a simplified quasi-one-dimensional analytical model for the series resistance, a ray tracing simulation for the optical losses and analytical and numerical simulations for the recombination losses. Experimental measurements of the specific losses are in a good agreement with the modeled values. The reduction of the cell efficiency due to the three processes was determined to be 3...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
The knowledge of the loss mechanisms in industrial back-contact back-junction (BC BJ) silicon solar ...
The presented paper develops a model to simulate the J-V characteristic of an industrially structuri...
In this paper we present the Fraunhofer ISE approach to high-efficiency back-contact back-junction (...
The influence of recombination losses on the short-circuit current density Jsc of back-contacted bac...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
This work presents a study based on electro-optical numerical simulations of the impact of geometric...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
This work presents a study based on electro-optical numerical simulations of the impact of geometric...
This work presents a study based on electro-optical numerical simulations of the impact of geometric...
AbstractIn this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
The knowledge of the loss mechanisms in industrial back-contact back-junction (BC BJ) silicon solar ...
The presented paper develops a model to simulate the J-V characteristic of an industrially structuri...
In this paper we present the Fraunhofer ISE approach to high-efficiency back-contact back-junction (...
The influence of recombination losses on the short-circuit current density Jsc of back-contacted bac...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
This work presents a study based on electro-optical numerical simulations of the impact of geometric...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
This work presents a study based on electro-optical numerical simulations of the impact of geometric...
This work presents a study based on electro-optical numerical simulations of the impact of geometric...
AbstractIn this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
In this work, by exploiting two-dimensional (2-D) TCAD numerical simulations, we performed a study o...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...
This paper presents a detailed analysis of the recombination losses in an interdigitated back-contac...