Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Research into this field has seen significant activity started about five years ago. Recently, interest appears to have fallen off somewhat. Also, while a lot of focus has been put on research fundamentals, extremely few applications in industry have been reported so far. Therefore, a group including Infineon Technologies as a leading semiconductor IDM and various universities and research institutes, as well as an EDA provider has tackled key challenges to enable statistical design in industry in a publicly funded project called "Sigma65". Sigma65 strives to provide key foundations to allow a change from traditional deterministic design methods...
textWith aggressive technology scaling, within-die random variations are becoming the most dominant...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
Abstract—In this paper, we propose a statistical gate sizing ap-proach to maximize the timing yield ...
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Res...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
textThe increased variability of process and environmental parameters is having a significant impac...
textThe increased variability of process and environmental parameters is having a significant impac...
Today, power consumption plays an important role in digital IC design. Demands come from the applica...
Abstract—As technology scales into the sub-90nm domain, manufacturing variations become an increasin...
DoctorAs technology node shrinks, process variation (PV) becomes a major concern in circuit design. ...
UnrestrictedThe rapid scaling of silicon technologies over the past decade has introduced some arduo...
The continuous scaling of physical dimensions has strongly increased circuit performance variability...
Aggressive device scaling has made it imperative to account for process variations in the design flo...
The continuous scaling of physical dimensions has strongly increased circuit performance variability...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
textWith aggressive technology scaling, within-die random variations are becoming the most dominant...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
Abstract—In this paper, we propose a statistical gate sizing ap-proach to maximize the timing yield ...
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Res...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
textThe increased variability of process and environmental parameters is having a significant impac...
textThe increased variability of process and environmental parameters is having a significant impac...
Today, power consumption plays an important role in digital IC design. Demands come from the applica...
Abstract—As technology scales into the sub-90nm domain, manufacturing variations become an increasin...
DoctorAs technology node shrinks, process variation (PV) becomes a major concern in circuit design. ...
UnrestrictedThe rapid scaling of silicon technologies over the past decade has introduced some arduo...
The continuous scaling of physical dimensions has strongly increased circuit performance variability...
Aggressive device scaling has made it imperative to account for process variations in the design flo...
The continuous scaling of physical dimensions has strongly increased circuit performance variability...
textAs device geometries shrink, variability of process parameters becomes pronounced, resulting in ...
textWith aggressive technology scaling, within-die random variations are becoming the most dominant...
DoctorAggressive technology scaling makes the process variations a significant problem in VLSI desig...
Abstract—In this paper, we propose a statistical gate sizing ap-proach to maximize the timing yield ...