Embedded software systems are increasingly used in safety-critical applications. When developing safety-critical embedded-software systems, stringent requirements must be fulfilled for memory and code execution integrity. The IEC 61508 explicitly asks for the usage and assessment of efficient algorithms that detect and correct bit errors in all types of memories, e.g., flash memories, and processing units that are either part of or interact with safety related systems that implement safety functions in accordance with the required safety integrity level (SIL). This paper shows which as well as how well-known algorithms for bit error detection, e.g., Hamming codes, can be used in a safety-critical generic sample system in the military fuzing...
Today’s electronics in aviation (avionics) are more complex than ever before. With higher requiremen...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
This thesis deals with techniques for designing and evaluating error detection and recovery mechanis...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Abstract:-Computer Systems used in Military and other challenging applications, are often exposed to...
[[abstract]]We present an error catch and analysis (ECA) system for semiconductor memories. The syst...
Built-in-test (BIT) is responsible for equipment fault detection, so the test data correctness direc...
The past decade, embedded systems are being used extensively. Although the power consumption has bee...
Increasing design complexity for current and future generations of microelectronic technologies lead...
Hamming codes are widely used for the single bit error correction double bit error detection (SEC-DE...
Due to advance technologies transistor size shrinks which makes the devices more vulnerable to noise...
AbstractBuilt-in-test (BIT) is responsible for equipment fault detection, so the test data correctne...
Data communication performed at any time does not always go well, sometimes also happens th...
Error Correcting Code (ECC) techniques aims at providing concurrent correction and detection of sing...
This thesis discusses the types of transient faults caused by heavy-ion or a-particle radiation that...
Today’s electronics in aviation (avionics) are more complex than ever before. With higher requiremen...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
This thesis deals with techniques for designing and evaluating error detection and recovery mechanis...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Abstract:-Computer Systems used in Military and other challenging applications, are often exposed to...
[[abstract]]We present an error catch and analysis (ECA) system for semiconductor memories. The syst...
Built-in-test (BIT) is responsible for equipment fault detection, so the test data correctness direc...
The past decade, embedded systems are being used extensively. Although the power consumption has bee...
Increasing design complexity for current and future generations of microelectronic technologies lead...
Hamming codes are widely used for the single bit error correction double bit error detection (SEC-DE...
Due to advance technologies transistor size shrinks which makes the devices more vulnerable to noise...
AbstractBuilt-in-test (BIT) is responsible for equipment fault detection, so the test data correctne...
Data communication performed at any time does not always go well, sometimes also happens th...
Error Correcting Code (ECC) techniques aims at providing concurrent correction and detection of sing...
This thesis discusses the types of transient faults caused by heavy-ion or a-particle radiation that...
Today’s electronics in aviation (avionics) are more complex than ever before. With higher requiremen...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
This thesis deals with techniques for designing and evaluating error detection and recovery mechanis...