Voids in solder joints are representing one of the main problems especially for power electronics. A low and homogeneous thermal resistance of solder joints is demanded for a quick and uniform conduction of the heat loss from the power chip. The same applies for the electrical conductivity of solder joints. Enclosed voids can cause a displacement of electrical and thermal paths and a local concentration of power and heat. In addition, gas voids are anxious to form spheres in the solder gap, which could be a cause for tilting of chip components and a wedge-shaped solder gap. This is tightening the problem of patchy distribution of current or heat and is causing stress and cracks. The amount of voids can be influenced by different measures, e...
The electronics industry strives for miniaturization and diversification of functionality while the ...
The sporadic occurrence of voids within intermetallic compounds during microelectronic soldering is ...
This paper deals with relationship of soldering profile, void formation and mechanical strength of r...
Solder thermal interface materials are often used in power semiconductors to enhance heat dissipatio...
After lead-free technology, pre-existing voids in Power-MOSFET device solder connections have been a...
textVoids in solder bumps have been a critical reliability issue as electronic components continue ...
textVoids in solder bumps have been a critical reliability issue as electronic components continue ...
Chip scale package (CSP) technology offers promising solutions to package power device due to its re...
Voiding in solder joints poses a serious reliability concern for electronic products. The aim of thi...
Increasing void contents has been discovered in the course of conversion to lead-free materials in t...
Voiding in solder joints poses a serious reliability concern for electronic products. The aim of thi...
Void is defined such as blow hole in the solder joint. Voids may degrade the mechanical and conducti...
This paper deals with solderability of thick printed copper substrates using formic acid vapours in ...
This article is focused on both macro and microvoids in soldered joints and the use of additional fl...
The aim of this work is to analyze reliability of lead-free solder join, in particular the voids gen...
The electronics industry strives for miniaturization and diversification of functionality while the ...
The sporadic occurrence of voids within intermetallic compounds during microelectronic soldering is ...
This paper deals with relationship of soldering profile, void formation and mechanical strength of r...
Solder thermal interface materials are often used in power semiconductors to enhance heat dissipatio...
After lead-free technology, pre-existing voids in Power-MOSFET device solder connections have been a...
textVoids in solder bumps have been a critical reliability issue as electronic components continue ...
textVoids in solder bumps have been a critical reliability issue as electronic components continue ...
Chip scale package (CSP) technology offers promising solutions to package power device due to its re...
Voiding in solder joints poses a serious reliability concern for electronic products. The aim of thi...
Increasing void contents has been discovered in the course of conversion to lead-free materials in t...
Voiding in solder joints poses a serious reliability concern for electronic products. The aim of thi...
Void is defined such as blow hole in the solder joint. Voids may degrade the mechanical and conducti...
This paper deals with solderability of thick printed copper substrates using formic acid vapours in ...
This article is focused on both macro and microvoids in soldered joints and the use of additional fl...
The aim of this work is to analyze reliability of lead-free solder join, in particular the voids gen...
The electronics industry strives for miniaturization and diversification of functionality while the ...
The sporadic occurrence of voids within intermetallic compounds during microelectronic soldering is ...
This paper deals with relationship of soldering profile, void formation and mechanical strength of r...