Herausforderungen und Lösungsansätze für die Berücksichtigung des Alterungsverhaltens beim Entwurf integrierter Schaltungen

For a couple of years now, reliability of integrated circuits has been an important topic in research and industry. The main focus has mostly been on degradation due to ageing. A lot of methods were published on different aspects from physical degradation modeling to system-level considerations. However, a lot of open issues remain. Persisting challenges and potential solution approaches are discussed in this paper. Although the detailed implementation of advanced methods is left for future research, simulation examples demonstrate the significance of ageing simulations