Excellent surface passivation is a key feature of high-efficiency c-Si solar cell concepts. Manz AG in collaboration with Fraunhofer ISE has developed a high-power-plasma (HPP) vertical plasma-enhanced chemical vapour deposition (PECVD) system that allows the preparation of excellently passivating hydrogenated amorphous silicon nitride (SiNx) and aluminium oxide (Al2O3) films at high deposition rates, leading to a throughput of about 1200 wafers per hour for one deposited film at a small footprint of the tool. Double layer SiNx front surface anti-reflection coatings (ARC) were outperforming the reference processes at Fraunhofer ISE. Al2O3 layers reached the same level of passivation compared to the reference PECVD process. Control of carbon...
Plasma-enhanced chemical vapor deposited (PECVD) aluminum oxide (AlOx) layers were developed using a...
The deposition rate of the standard (i.e. sequential) atomic layer deposition (ALD) process is very ...
AbstractThe surface passivation properties of aluminium oxide (Al2O3) on crystalline Si are compared...
Manz has developed a novel plasma enhanced chemical vapour deposition (PECVD) system combining both,...
Passivated and locally rear contacted solar cell concepts are currently leaping forward towards indu...
A high-rate plasma-enhanced chemical-vapor-deposition (PECVD) process for aluminium oxide layers was...
In this study, we report on the passivation quality of atomic layer deposition grown ultra-thin Al2O...
AbstractAn innovative method to obtain antireflection and passivation coatings on p-type crystalline...
This work demonstrates the efficient optical and passivation properties provided by hydrogenated sil...
International audienceDense hydrogenated silicon nitride (SiNx:H) layers for photovoltaics are made ...
A high-deposition-rate plasma-enhanced chemical-vapor-deposition (PECVD) technique has been used to ...
We present independently confirmed efficiencies of 21.4% for PERC cells with plasma-assisted atom-ic...
During the last few years aluminum oxide became an inescapable passivation layer in the Si photovolt...
AbstractThe deposition rate of the standard (i.e. sequential) atomic layer deposition (ALD) process ...
AbstractAn Atmospheric Pressure Plasma Enhanced Chemical Vapor Deposition (AP-PECVD) is under develo...
Plasma-enhanced chemical vapor deposited (PECVD) aluminum oxide (AlOx) layers were developed using a...
The deposition rate of the standard (i.e. sequential) atomic layer deposition (ALD) process is very ...
AbstractThe surface passivation properties of aluminium oxide (Al2O3) on crystalline Si are compared...
Manz has developed a novel plasma enhanced chemical vapour deposition (PECVD) system combining both,...
Passivated and locally rear contacted solar cell concepts are currently leaping forward towards indu...
A high-rate plasma-enhanced chemical-vapor-deposition (PECVD) process for aluminium oxide layers was...
In this study, we report on the passivation quality of atomic layer deposition grown ultra-thin Al2O...
AbstractAn innovative method to obtain antireflection and passivation coatings on p-type crystalline...
This work demonstrates the efficient optical and passivation properties provided by hydrogenated sil...
International audienceDense hydrogenated silicon nitride (SiNx:H) layers for photovoltaics are made ...
A high-deposition-rate plasma-enhanced chemical-vapor-deposition (PECVD) technique has been used to ...
We present independently confirmed efficiencies of 21.4% for PERC cells with plasma-assisted atom-ic...
During the last few years aluminum oxide became an inescapable passivation layer in the Si photovolt...
AbstractThe deposition rate of the standard (i.e. sequential) atomic layer deposition (ALD) process ...
AbstractAn Atmospheric Pressure Plasma Enhanced Chemical Vapor Deposition (AP-PECVD) is under develo...
Plasma-enhanced chemical vapor deposited (PECVD) aluminum oxide (AlOx) layers were developed using a...
The deposition rate of the standard (i.e. sequential) atomic layer deposition (ALD) process is very ...
AbstractThe surface passivation properties of aluminium oxide (Al2O3) on crystalline Si are compared...