The motivation of this study is to provide answers to questions rising with 3D stacking of semiconductor chips. This includes the development and validation of concepts for 1) Through Silicon Via (TSV) formation, 2) metal layer build-up, 3) various types of assembly and packaging concepts and methods, as well as 4) process characterization. The investigations discussed here have been conducted on test wafer (ATEC2) developed by Fraunhofer IZM-ASSID. This design contains dedicated test structures which have been implemented to enable different unit processes and allows easy physical analysis. One of those test structures has been used to study the impact of the TSV density on the stress generation after TSV fill, anneal and CMP (chemical mec...
The demand for more functionality in a smaller amount of space has driven the microelectronics indus...
There is an increasing demand for electronic devices with smaller sizes, higher performance and incr...
The paper addresses the through silicon via (TSV) filling using electrochemical deposition (ECD) of ...
Three-dimensional (3D) integrated circuit (IC) technologies are receiving increasing attention due t...
Three-dimensional (3D) integrated circuit (IC) technologies are receiving increasing attention due t...
The through-silicon via (TSV) approach is crucial for three-dimensional integrated circuit (3-D IC) ...
3D integration with TSVs (Through Silicon Via) is emerging as a promising technology for the next ge...
Successful implementation of 3D integration technology requires understanding of the unique yield an...
The background of this paper is the fabrication of Through Silicon Vias (TSV) for three-dimensional ...
For 3D stacked flip chip packages, through silicon vias (TSVs) are employed as vertical interconnect...
Abstract-Two dimensional (2D) integration has been the tra-ditional approach for IC integration. Inc...
Abstract-Two dimensional (2D) integration has been the tra-ditional approach for IC integration. Inc...
Microelectronic systems continue to move to towards 3-D integration to meet the increasing demands, ...
For the electrochemical filling of through silicon vias (TSVs) the geometry of these vias as well as...
The demand for more functionality in a smaller amount of space has driven the microelectronics indus...
The demand for more functionality in a smaller amount of space has driven the microelectronics indus...
There is an increasing demand for electronic devices with smaller sizes, higher performance and incr...
The paper addresses the through silicon via (TSV) filling using electrochemical deposition (ECD) of ...
Three-dimensional (3D) integrated circuit (IC) technologies are receiving increasing attention due t...
Three-dimensional (3D) integrated circuit (IC) technologies are receiving increasing attention due t...
The through-silicon via (TSV) approach is crucial for three-dimensional integrated circuit (3-D IC) ...
3D integration with TSVs (Through Silicon Via) is emerging as a promising technology for the next ge...
Successful implementation of 3D integration technology requires understanding of the unique yield an...
The background of this paper is the fabrication of Through Silicon Vias (TSV) for three-dimensional ...
For 3D stacked flip chip packages, through silicon vias (TSVs) are employed as vertical interconnect...
Abstract-Two dimensional (2D) integration has been the tra-ditional approach for IC integration. Inc...
Abstract-Two dimensional (2D) integration has been the tra-ditional approach for IC integration. Inc...
Microelectronic systems continue to move to towards 3-D integration to meet the increasing demands, ...
For the electrochemical filling of through silicon vias (TSVs) the geometry of these vias as well as...
The demand for more functionality in a smaller amount of space has driven the microelectronics indus...
The demand for more functionality in a smaller amount of space has driven the microelectronics indus...
There is an increasing demand for electronic devices with smaller sizes, higher performance and incr...
The paper addresses the through silicon via (TSV) filling using electrochemical deposition (ECD) of ...