The method involves covering a measurement object surface partially with a measuring film (14) and measuring a film structure. A measurement process is carried out on a target surface covered with the measuring film. Electromagnetic radiation (13a) is radiated on a measuring film using an irradiating process. The electromagnetic radiation is partially and diffusely scattered on the measuring film. The measuring film is pressed based on pressure difference between two spaces adjacent to the measuring film. An independent claim is also included for a system for determining a surface shape of a measured object
DE 102009056467 A1 UPAB: 20110621 NOVELTY - The method involves defining a surface as a start surfac...
The invention relates to a device and to a method for detecting at least partially reflective surfac...
A measuring arrangement includes an electrostatic concentrator, a surface and an imaging sensor whic...
DE 10063293 A UPAB: 20020924 NOVELTY - The method involves exposing the surface to radiation with a ...
EP 1837623 A1 UPAB: 20071031 NOVELTY - The method involves forming a light pattern over a surface th...
DE 102009023279 A1 UPAB: 20110101 NOVELTY - The device (1) has a carrier substrate (10) with readabl...
The invention relates to a device for spatially measuring surfaces, comprising a projector (2) for p...
DE 10142206 A UPAB: 20030703 NOVELTY - To measure the depth of cut drillings and grooves at a substr...
DE 102006027182 A1 UPAB: 20071129 NOVELTY - The method involves determining a movement trajectory on...
DE 10205435 C UPAB: 20030906 NOVELTY - Position of the point (4) is determined at two different time...
The invention relates to an arrangement for determining characteristics and/or parameters of a sampl...
By virtue of their non-touch and non-destructive principle it is that optical measuring and testing ...
The method involves illuminating an object using at least a light source, and a light-transmissive p...
DE 19922614 A UPAB: 20000807 NOVELTY - The method involves providing reference signatures of fine st...
WO 2009065369 A1 UPAB: 20090609 NOVELTY - The method involves providing a set of microwave antenna u...
DE 102009056467 A1 UPAB: 20110621 NOVELTY - The method involves defining a surface as a start surfac...
The invention relates to a device and to a method for detecting at least partially reflective surfac...
A measuring arrangement includes an electrostatic concentrator, a surface and an imaging sensor whic...
DE 10063293 A UPAB: 20020924 NOVELTY - The method involves exposing the surface to radiation with a ...
EP 1837623 A1 UPAB: 20071031 NOVELTY - The method involves forming a light pattern over a surface th...
DE 102009023279 A1 UPAB: 20110101 NOVELTY - The device (1) has a carrier substrate (10) with readabl...
The invention relates to a device for spatially measuring surfaces, comprising a projector (2) for p...
DE 10142206 A UPAB: 20030703 NOVELTY - To measure the depth of cut drillings and grooves at a substr...
DE 102006027182 A1 UPAB: 20071129 NOVELTY - The method involves determining a movement trajectory on...
DE 10205435 C UPAB: 20030906 NOVELTY - Position of the point (4) is determined at two different time...
The invention relates to an arrangement for determining characteristics and/or parameters of a sampl...
By virtue of their non-touch and non-destructive principle it is that optical measuring and testing ...
The method involves illuminating an object using at least a light source, and a light-transmissive p...
DE 19922614 A UPAB: 20000807 NOVELTY - The method involves providing reference signatures of fine st...
WO 2009065369 A1 UPAB: 20090609 NOVELTY - The method involves providing a set of microwave antenna u...
DE 102009056467 A1 UPAB: 20110621 NOVELTY - The method involves defining a surface as a start surfac...
The invention relates to a device and to a method for detecting at least partially reflective surfac...
A measuring arrangement includes an electrostatic concentrator, a surface and an imaging sensor whic...