Optical projection lithography has been the key technology for the ongoing miniaturization in semiconductor devices over the past 40 years. This issue features original research covering mask and image modeling methods and computational techniques for various inverse problems in advanced lithography, including source and mask optimization, wavefront retrieval, and design of Fresnel lenses
Lithography techniques have long been the driving power for the advancement of Moore’s law for the s...
This article reviews modeling approaches for optical and extreme ultraviolet (EUV) projection lithog...
For semiconductor manufacturers moving toward advanced technology nodes –32nm, 22nm and below – lith...
Optical projection lithography has been the key technology for the ongoing miniaturization in semico...
Lithographic processes belong to the most critical steps in the fabrication of microelectronic circu...
IEEE International Conference on Image ProcessingThe continual shrinkage of minimum feature size in ...
As predicted by Moore's law, the number of components in integrated circuits is ever-growing. Since ...
The continuous shrinkage of minimum feature size in integrated circuit (IC) fabrication incurs more ...
The continual shrinkage of minimum feature size in inte-grated circuit (IC) fabrication incurs more ...
With lithography parameters approaching their limits, continuous improvement requires increasing dia...
Lithographic processes belong to the most critical steps in the fabrication of m icroelectronic circ...
The presentation reviews optics- and material-driven resolution enhancements in DUV and EUV projecti...
With the development and production of integrated circuits at the 22nm node, optical lithography fac...
Abstract—An efficient algorithm based on the pixel-based mask representation is proposed for fast sy...
Lithography simulation has become an indispensable tool for understanding and optimization of lithog...
Lithography techniques have long been the driving power for the advancement of Moore’s law for the s...
This article reviews modeling approaches for optical and extreme ultraviolet (EUV) projection lithog...
For semiconductor manufacturers moving toward advanced technology nodes –32nm, 22nm and below – lith...
Optical projection lithography has been the key technology for the ongoing miniaturization in semico...
Lithographic processes belong to the most critical steps in the fabrication of microelectronic circu...
IEEE International Conference on Image ProcessingThe continual shrinkage of minimum feature size in ...
As predicted by Moore's law, the number of components in integrated circuits is ever-growing. Since ...
The continuous shrinkage of minimum feature size in integrated circuit (IC) fabrication incurs more ...
The continual shrinkage of minimum feature size in inte-grated circuit (IC) fabrication incurs more ...
With lithography parameters approaching their limits, continuous improvement requires increasing dia...
Lithographic processes belong to the most critical steps in the fabrication of m icroelectronic circ...
The presentation reviews optics- and material-driven resolution enhancements in DUV and EUV projecti...
With the development and production of integrated circuits at the 22nm node, optical lithography fac...
Abstract—An efficient algorithm based on the pixel-based mask representation is proposed for fast sy...
Lithography simulation has become an indispensable tool for understanding and optimization of lithog...
Lithography techniques have long been the driving power for the advancement of Moore’s law for the s...
This article reviews modeling approaches for optical and extreme ultraviolet (EUV) projection lithog...
For semiconductor manufacturers moving toward advanced technology nodes –32nm, 22nm and below – lith...