A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot electrons through a buried interface, was successfully applied to study the Al2O3 barrier in the Co/Al2O3/Ru tunnel junction. This technique enabled us to straightforwardly measure an effective barrier height of 1.7 eV and to observe the rise of the barrier height due to continuous current injection into a single point of the junction attributed to charging effects and/or degradation of the barrier structure. Scanning over an area of 510 nm×510 nm showed a spatial inhomogenity of the barrier resulting in different dependencies of the BEEM current on the energy of the injected electrons
We present two approaches for studying the uniformity of a tunnel barrier. The first approach is bas...
In this paper, experiments performed on Au-Si (100) junctions by Ballistic Electron Emission Microsc...
In this paper, experiments performed on Au-Si (100) junctions by Ballistic Electron Emission Microsc...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
Abstract. The objective of the contract was the investigation of hot electron transport on a microsc...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
We have directly measured the thickness distribution of the tunnel barriers in state-of-the-art Al/A...
We present two approaches for studying the uniformity of a tunnel barrier. The first approach is bas...
In this paper, experiments performed on Au-Si (100) junctions by Ballistic Electron Emission Microsc...
In this paper, experiments performed on Au-Si (100) junctions by Ballistic Electron Emission Microsc...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
A modified ballistic electron emission microscopy (BEEM) technique using local transport of hot elec...
Abstract. The objective of the contract was the investigation of hot electron transport on a microsc...
In 1988, Kaiser and Bell first demonstrated the unique capability of Ballistic Electron Emission Mic...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
The tunnel momentum distribution in a (magnetic) tunnel junction is probed by analyzing the decay of...
We have directly measured the thickness distribution of the tunnel barriers in state-of-the-art Al/A...
We present two approaches for studying the uniformity of a tunnel barrier. The first approach is bas...
In this paper, experiments performed on Au-Si (100) junctions by Ballistic Electron Emission Microsc...
In this paper, experiments performed on Au-Si (100) junctions by Ballistic Electron Emission Microsc...