The practical problems in quant. electron probe microanal. of the ultra-light elements B, C, N, and O are discussed and solns. to these problems are given. It is shown that the basic requirement for accurate intensity measurements is the integral recording of the light element emission peaks in order to deal with the strong alterations in the peak shapes that sometimes occur. It is demonstrated that when these effects are properly accounted for and a good matrix correction program in conjunction with consistent mass absorption coeffs. is used good quant. results can be obtained. [on SciFinder (R)
On évalue les modèles de correction utilisés en microanalyse des éléments légers. On examine particu...
We have developed an electron beam excitation ultra soft X ray add on device for a scanning electron...
SIGLELD:D48055/83 / BLDSC - British Library Document Supply CentreGBUnited Kingdo
The electron probe microanal. (EPMA) of B,C, and O using wavelength dispersive techniques requires c...
Due to the rapid development and expansion ofmate-rials science into new areas such as high-temperat...
The developments in the field of quant. electron probe microanal (EPMA) of ultralight elements in th...
Quantitative electron probe microanalysis of boron has been performed in 28 binary borides in the ra...
International audienceSince the development of multilayer dispersive elements with large periods, th...
International audienceQuantitative electron probe microanalysis (EPMA) by wavelength dispersive spec...
Electron probe microanalysis (EPMA) is presented as a versatile technique of local quantitative anal...
We compared Hall's peak to continuum ratio method with a peak ratio method in order to quantify ligh...
International audienceElectron probe microanalysis (EPMA) is a reliable and widely used technique to...
Des couches minces de l'ordre de 200 µg/cm2, obtenues par évaporation et pulvérisation ont été étudi...
The use of electron probe microanalysis (EPMA) at low voltage allows improvements in the lateral res...
Electron probe microanalysis (EPMA) is a fairly mature analytical technique which has been widely us...
On évalue les modèles de correction utilisés en microanalyse des éléments légers. On examine particu...
We have developed an electron beam excitation ultra soft X ray add on device for a scanning electron...
SIGLELD:D48055/83 / BLDSC - British Library Document Supply CentreGBUnited Kingdo
The electron probe microanal. (EPMA) of B,C, and O using wavelength dispersive techniques requires c...
Due to the rapid development and expansion ofmate-rials science into new areas such as high-temperat...
The developments in the field of quant. electron probe microanal (EPMA) of ultralight elements in th...
Quantitative electron probe microanalysis of boron has been performed in 28 binary borides in the ra...
International audienceSince the development of multilayer dispersive elements with large periods, th...
International audienceQuantitative electron probe microanalysis (EPMA) by wavelength dispersive spec...
Electron probe microanalysis (EPMA) is presented as a versatile technique of local quantitative anal...
We compared Hall's peak to continuum ratio method with a peak ratio method in order to quantify ligh...
International audienceElectron probe microanalysis (EPMA) is a reliable and widely used technique to...
Des couches minces de l'ordre de 200 µg/cm2, obtenues par évaporation et pulvérisation ont été étudi...
The use of electron probe microanalysis (EPMA) at low voltage allows improvements in the lateral res...
Electron probe microanalysis (EPMA) is a fairly mature analytical technique which has been widely us...
On évalue les modèles de correction utilisés en microanalyse des éléments légers. On examine particu...
We have developed an electron beam excitation ultra soft X ray add on device for a scanning electron...
SIGLELD:D48055/83 / BLDSC - British Library Document Supply CentreGBUnited Kingdo