Functional materials are challenging to characterize because of the presence of small structures and inhomogeneous materials. If interference microscopy was initially developed for use for the optical profilometry of homogeneous, static surfaces, it has since been considerably improved in its capacity to measure a greater variety of samples and parameters. This review presents our own contributions to extending the usefulness of interference microscopy. For example, 4D microscopy allows real-time topographic measurement of moving or changing surfaces. High-resolution tomography can be used to characterize transparent layers; local spectroscopy allows the measurement of local optical properties; and glass microspheres improve the lateral res...
Optical interferometers are instruments that can make very precise object measurements using the int...
Additive manufacturing (AM) is increasingly being used to fabricate fully functional parts. In this ...
The most common optical technologies for surface topography measurement are coherence scanning inter...
Functional materials are challenging to characterize because of the presence of small structures and...
We demonstrate the adaption of a further developed Mach–Zehnder interference (MZI) microscope for th...
Manufacturers nowadays have access to state-of-the-art areal surface topography measurement instrume...
The lens-free interferometric microscope (?LIM?) developed at ICFO by Roland Terborg et al. offers a...
The demand for surface metrology has been increasing over several decades, with industrial requireme...
Emergence of products that feature functional surfaces with complex geometries, such as freeform opt...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
International audienceThe development of new technologies and innovative products today is often acc...
The master´s thesis deals with the study of optical properties of thin transparent layers on the org...
International audienceCharacterizing very small particles, from a few dozen micrometers to the nanom...
International audienceThin films of polyelectrolyte multilayers composed of alternating layers of po...
La microscopie interférométrique est une méthode de mesure qui repose sur l’acquisition et le traite...
Optical interferometers are instruments that can make very precise object measurements using the int...
Additive manufacturing (AM) is increasingly being used to fabricate fully functional parts. In this ...
The most common optical technologies for surface topography measurement are coherence scanning inter...
Functional materials are challenging to characterize because of the presence of small structures and...
We demonstrate the adaption of a further developed Mach–Zehnder interference (MZI) microscope for th...
Manufacturers nowadays have access to state-of-the-art areal surface topography measurement instrume...
The lens-free interferometric microscope (?LIM?) developed at ICFO by Roland Terborg et al. offers a...
The demand for surface metrology has been increasing over several decades, with industrial requireme...
Emergence of products that feature functional surfaces with complex geometries, such as freeform opt...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
International audienceThe development of new technologies and innovative products today is often acc...
The master´s thesis deals with the study of optical properties of thin transparent layers on the org...
International audienceCharacterizing very small particles, from a few dozen micrometers to the nanom...
International audienceThin films of polyelectrolyte multilayers composed of alternating layers of po...
La microscopie interférométrique est une méthode de mesure qui repose sur l’acquisition et le traite...
Optical interferometers are instruments that can make very precise object measurements using the int...
Additive manufacturing (AM) is increasingly being used to fabricate fully functional parts. In this ...
The most common optical technologies for surface topography measurement are coherence scanning inter...