International audienceThis paper deals with statistical inference for lifetime data in presence of imperfect maintenance. For the maintenance model, the Sheu and Griffith model is considered. The lifetime distribution belongs to exponential distribution class. The maximum likelihood estimation procedure of the model parameters is discussed, and confidence intervals are provided using the asymptotic likelihood theory and bootstrap approach. Based on conjugate and discrete priors, Bayesian estimators of the model parameters are developed under symmetric and asymmetric loss functions. The proposed methodologies are applied to simulated data and sensitivity analysis to different parameters and data characteristics is carried out. The effect of ...
The paper introduces ageing models of repairable components based on Bayesian approach. Models for t...
International audienceThe simultaneous modeling of ageing and maintenance efficiency of repairable s...
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime d...
In this paper we suggest a tabular structure for maintenance or reliability data. Also we propose a ...
International audienceThis paper studies the statistical inference in a degradation model with imper...
International audienceThe aim of this paper is to introduce and study a new model of imperfect maint...
Cette thèse est consacrée à la modélisation de la maintenance imparfaite par les modèles statistique...
International audienceThe paper considers complex industrial systems with incomplete maintenance his...
The types of repairs considered in this research are: (i) perfect repair, (ii) imperfect repair and ...
The thesis analyses imperfect maintenance processes of industrial systems by statistical models. Imp...
This thesis deals with inference procedures for some parametric lifetime models, involving single as...
In reliability theory, the most important problem is to determine the reliability of a complex syste...
ACLInternational audienceThis paper analyzes three time-based replacement policies when the paramete...
In the masked system lifetime data, the exact component that causes the system's failure is oft...
Bayes estimates of the unknown parameter and the reliability function for the generalized exponentia...
The paper introduces ageing models of repairable components based on Bayesian approach. Models for t...
International audienceThe simultaneous modeling of ageing and maintenance efficiency of repairable s...
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime d...
In this paper we suggest a tabular structure for maintenance or reliability data. Also we propose a ...
International audienceThis paper studies the statistical inference in a degradation model with imper...
International audienceThe aim of this paper is to introduce and study a new model of imperfect maint...
Cette thèse est consacrée à la modélisation de la maintenance imparfaite par les modèles statistique...
International audienceThe paper considers complex industrial systems with incomplete maintenance his...
The types of repairs considered in this research are: (i) perfect repair, (ii) imperfect repair and ...
The thesis analyses imperfect maintenance processes of industrial systems by statistical models. Imp...
This thesis deals with inference procedures for some parametric lifetime models, involving single as...
In reliability theory, the most important problem is to determine the reliability of a complex syste...
ACLInternational audienceThis paper analyzes three time-based replacement policies when the paramete...
In the masked system lifetime data, the exact component that causes the system's failure is oft...
Bayes estimates of the unknown parameter and the reliability function for the generalized exponentia...
The paper introduces ageing models of repairable components based on Bayesian approach. Models for t...
International audienceThe simultaneous modeling of ageing and maintenance efficiency of repairable s...
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime d...