Influence of self-affine interface roughness on the charge capacitance between two dielectric media

In this paper we investigate the influence of the interface roughness on the charge capacitance between two different dielectric media. Assuming the roughness fluctuations to be self-affine, it is shown that the roughness exponent H. which characterizes short wavelength roughness fluctuations, plays the dominant role with respect to the rms roughness amplitude w and the lateral correlation length xi. Furthermore, it is shown that any evolution of the interface roughness under conditions leading to time variant local interface slope will have significant influence on charge capacitance properties.