High resolution electron microscopy of misfit dislocations at metal-oxide interfaces

Misfit dislocations at metal-oxide interfaces are studied using HRTEM. By observing misfit dislocations the bonding across the metal-oxide interface can be studied. This is done for two cases, a parallel Cu-MgO {111} interface and tilted interfaces in Pd-ZnO and Ag-ZnO. From the Cu-MgO micrographs the strain fields introduced by the misfit dislocation network could be observed. From the tilted ZnO interfaces it can be seen how different materials (Ag, Pd) adapt to this situation.