X-ray-reflectivity measurements have been carried out on silver films which were vapor deposited onto silicon substrates, to investigate the thickness evolution of the film’s surface roughness. The growth exponent was found to be β=0.26±0.05, and the roughness exponenet was found to be H=0.70±0.10
In this paper the results of an examination of the surface roughness and morphology dependence of si...
This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigat...
Real time in situ synchrotron x-ray studies of continuous Pb deposition on Si(111)-(7 × 7) at 180 K...
X-ray-reflectivity measurements have been carried out on silver films which were vapor deposited ont...
The spatial and temporal scaling behaviors of vapor-deposited silver films have been investigated by...
91 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.X-ray reflectivity measurement...
[[abstract]]The X-ray reflectivity method was used to measure in situ the surface roughness of a thi...
We investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a...
We studied the wetting behavior of silver and copper thin films versus their kinetic roughening upon...
The optical properties of inhomogeneously grown rough silver films have been analyzed on the basis o...
The authors have investigated the growth of thin silver films using a unique combination of atmosphe...
Ultra-thin silver films (thickness below 10 nm) are of great interest as optical coatings in low emi...
In this paper the results of an examination of the surface roughness and morphology dependence of si...
This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigat...
Real time in situ synchrotron x-ray studies of continuous Pb deposition on Si(111)-(7 × 7) at 180 K...
X-ray-reflectivity measurements have been carried out on silver films which were vapor deposited ont...
The spatial and temporal scaling behaviors of vapor-deposited silver films have been investigated by...
91 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.X-ray reflectivity measurement...
[[abstract]]The X-ray reflectivity method was used to measure in situ the surface roughness of a thi...
We investigated the crystallinity and optical parameters of silver layers of 10–35 nm thickness as a...
We studied the wetting behavior of silver and copper thin films versus their kinetic roughening upon...
The optical properties of inhomogeneously grown rough silver films have been analyzed on the basis o...
The authors have investigated the growth of thin silver films using a unique combination of atmosphe...
Ultra-thin silver films (thickness below 10 nm) are of great interest as optical coatings in low emi...
In this paper the results of an examination of the surface roughness and morphology dependence of si...
This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigat...
Real time in situ synchrotron x-ray studies of continuous Pb deposition on Si(111)-(7 × 7) at 180 K...
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