Research has shown that microprocessors and structures of the microprocessors are vulnerable to alpha Single Event Upsets that affect program correctness and reliability. In this thesis, we have explored the use of Modified Razor flip-flops in the microprocessor to increase the overall reliability of the microprocessor. We have adopted Architecturally Correct Execution (ACE) time based techniques to measure the Architecture Vulnerability Factor (AVF) of high performance microprocessors and their internal structures using the SPEC 2000 integer benchmarks. We have computed the reduction in AVF with the introduction of Modified Razor flip-flops for various combinations of bit-fields that have high vulnerability. However, introduction of Modifi...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
One of the major driving forces of the semiconductor industry is the continuous scaling of the silic...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Microprocessors are increasingly used in a variety of applications from small handheld calculators t...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
Over two decades of research has led to numerous low-power design techniques being reported. Two pop...
textReliability has emerged as a first class design concern, as a result of an exponential increase...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Technology scaling has led to growing concerns about reliability in microprocessors. Currently, faul...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
One of the major driving forces of the semiconductor industry is the continuous scaling of the silic...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Microprocessors are increasingly used in a variety of applications from small handheld calculators t...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
Over two decades of research has led to numerous low-power design techniques being reported. Two pop...
textReliability has emerged as a first class design concern, as a result of an exponential increase...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Technology scaling has led to growing concerns about reliability in microprocessors. Currently, faul...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
One of the major driving forces of the semiconductor industry is the continuous scaling of the silic...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...