This study addresses encapsulated wire bonds in chip-on-board (CoB) multi chip modules, which provide a low cost option for dealing with the current trend towards compact microelectronic packages with increased I/O, higher reliability and lower cost. The focus is on thermomechanical stresses caused in the bond wires when the encapsulant is cooled from high curing temperatures and subsequently subjected to thermal cycling loading. The stresses generated in bond wires due to thermal expansion mismatches, in an encapsulated CoB are very complex and are driven by both global and local thermal expansion mismatches between: (i) glob-top encapsulant and the silicon die, (ii) encapsulant and the wire, and (iii) encapsulant and the substrate assemb...
The solder in flip-chip assemblies experience high stress and strain because of thermal mismatch ind...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Thermally induced stress in electronic products is a growing concern for electronic package designer...
This study addresses encapsulated wire bonds in chip-on-board (CoB) multi chip modules, which provid...
Solid state power modules are subjected to harsh environmental and operational loads. Identifying th...
In this study the thermo-mechanical response of 25 μm Cu wire bonds in an LQFP-EPad (Low Profile Qua...
In this study the thermo-mechanical response of 25 μm Cu wire bonds in an LQFP-EPad package was inve...
In this study, the results of simulative and experimental investigations regarding thermal cycling (...
In current highly integrated microelectronic devices including system-in-package and stacked-die sol...
The local deformation behavior of the free air ball (FAB) and the heat affected zone (HAZ) of thermo...
In current highly integrated microelectronic devices, the thermosonic wire bond interconnections pla...
Today, power electronic reliability is a main subject of interest for many companies and laboratorie...
The project scope is related to solve the real life Semiconductor industrial problem.Interconnectio...
© The Authors, published by EDP Sciences, 2017. The flip chip bonding technology is widely used in e...
Copper (Cu) wire bonds have become the dominant wire material used in microelectronic packages, havi...
The solder in flip-chip assemblies experience high stress and strain because of thermal mismatch ind...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Thermally induced stress in electronic products is a growing concern for electronic package designer...
This study addresses encapsulated wire bonds in chip-on-board (CoB) multi chip modules, which provid...
Solid state power modules are subjected to harsh environmental and operational loads. Identifying th...
In this study the thermo-mechanical response of 25 μm Cu wire bonds in an LQFP-EPad (Low Profile Qua...
In this study the thermo-mechanical response of 25 μm Cu wire bonds in an LQFP-EPad package was inve...
In this study, the results of simulative and experimental investigations regarding thermal cycling (...
In current highly integrated microelectronic devices including system-in-package and stacked-die sol...
The local deformation behavior of the free air ball (FAB) and the heat affected zone (HAZ) of thermo...
In current highly integrated microelectronic devices, the thermosonic wire bond interconnections pla...
Today, power electronic reliability is a main subject of interest for many companies and laboratorie...
The project scope is related to solve the real life Semiconductor industrial problem.Interconnectio...
© The Authors, published by EDP Sciences, 2017. The flip chip bonding technology is widely used in e...
Copper (Cu) wire bonds have become the dominant wire material used in microelectronic packages, havi...
The solder in flip-chip assemblies experience high stress and strain because of thermal mismatch ind...
Aluminum wire bonds, as used in a ceramic air cavity package for LDMOS, will intrinsically be prone ...
Thermally induced stress in electronic products is a growing concern for electronic package designer...