Noise spectroscopy is essentially focused on the investigation of electric fluctuations produced by physical mechanisms intrinsic to conductor materials. Very complex electrical transport phenomena can be interpreted through the study of the fluctuation properties, which provide interesting information both from the point of view of basic research and of applications. In this respect, low-frequency electric noise analysis was proposed more than twenty years ago to determine the quality of solar cells and photovoltaic modules, and, more recently, for the reliability estimation of heterojunction solar cells. This spectroscopic tool is able to unravel specific aspects related to radiation damage. Moreover, it can be used for a detailed tempera...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor dev...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor dev...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
Low-frequency noise spectroscopy has been used to evaluate the recombination, the transport processe...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to ex...
Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor dev...