Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probability that a radiation-induced fault in a hardware structure will manifest as an error at the program output. AVF estimation requires detailed microarchitectural simulations which are time-consuming and typically present aggregate metrics. Moreover, it requires a large number of simulations to derive insight into the impact of microarchitectural events on AVF. In this work we present a first-order mechanistic analytical model for computing AVF by estimating the occupancy of correct-path state in important microarchitecture structures through inexpensive profiling. W...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
textReliability has emerged as a first class design concern, as a result of an exponential increase...
This paper presents a first-order analytical model for determining the performance degradation cause...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
textReliability has emerged as a first class design concern, as a result of an exponential increase...
This paper presents a first-order analytical model for determining the performance degradation cause...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...