Defect modes in microring resonator arrays fabricated in silicon-on-insulator technology
- Tobing, Landobasa YM
- Dumon, Pieter
- Baets, Roel
- Chin, Mee-Koy
Publication date
January 2008
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
We show experimentatly the existence of defect modes in mutually coupled microring resonator array fabricated in silicon-on-insulator technology. The movements of donor-like and acceptor-like modes are demonstrated for various defect lengths and in a good agreement with earlier theoretical prediction
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