Atomic layer deposition (ALD) of alumina using trimethyl aluminum (TMA) and water on amorphous alumina is analyzed using periodic-dispersion corrected DFT calculations. The energetics of the investigated reactions suggest that monomethyl aluminum (MMA) is the most abundant reaction intermediate at ALD operating conditions. The dominant reaction path toward the methylation of the surface is found to be adsorption of TMA on bridge oxygen via Lewis acid-base complex formation followed by ligand exchange reactions (LERs) with hydroxyls and surface water in its vicinity. Further adsorption and LERs of TMA leads to a saturated methylated surface (similar to 6.4 CH3 nm(-2)) which is in agreement with experimental observations and infrared spectra....
The surface chemical activity of an alumina films grown on Mo(100) by oxidation of aluminum evaporat...
The interactions of Al, O, and O2 with different α- Al2O3 (0001) surfaces have been studied using ab...
A method to obtain full mass over charge (m/z), time-resolved quadruple mass spectrometry (QMS) spec...
Atomic layer deposition (ALD) of alumina using trimethyl aluminum (TMA) and water on amorphous alumi...
Atomic layer deposition (ALD) of alumina using trimethyl aluminum (TMA) and water on amorphous alumi...
Atomic layer deposition (ALD) is a coating technology used to produce highly uniform thin films. Alu...
The atomic layer deposition (ALD) of metal oxides on metal surfaces is of great importance in applic...
Atomic layer deposition (ALD) is a coating technology used to produce highly uniform thin films. Alu...
During the last two decades, Atomic Layer Deposition (ALD) has emerged as the appropriate process to...
International audienceThe surface mechanisms involved in the Atomic Layer Deposition of Al2O3 from T...
In this work, the surface mechanisms including reaction, adsorption and desorption steps during the ...
The aluminum precursor plays a crucial role in the Al2O3 ALD process. To date, trimethylaluminum (TM...
Atomic layer deposition (ALD) is a method for thin-film growth with atomic thickness control, with m...
Alumina (Al2O3), a suitable replacement for silica (SiO2) as gate oxide in metal oxide semiconductor...
Plasma-enhanced atomic layer deposition (ALD) of metal oxides is a rapidly gaining interest especial...
The surface chemical activity of an alumina films grown on Mo(100) by oxidation of aluminum evaporat...
The interactions of Al, O, and O2 with different α- Al2O3 (0001) surfaces have been studied using ab...
A method to obtain full mass over charge (m/z), time-resolved quadruple mass spectrometry (QMS) spec...
Atomic layer deposition (ALD) of alumina using trimethyl aluminum (TMA) and water on amorphous alumi...
Atomic layer deposition (ALD) of alumina using trimethyl aluminum (TMA) and water on amorphous alumi...
Atomic layer deposition (ALD) is a coating technology used to produce highly uniform thin films. Alu...
The atomic layer deposition (ALD) of metal oxides on metal surfaces is of great importance in applic...
Atomic layer deposition (ALD) is a coating technology used to produce highly uniform thin films. Alu...
During the last two decades, Atomic Layer Deposition (ALD) has emerged as the appropriate process to...
International audienceThe surface mechanisms involved in the Atomic Layer Deposition of Al2O3 from T...
In this work, the surface mechanisms including reaction, adsorption and desorption steps during the ...
The aluminum precursor plays a crucial role in the Al2O3 ALD process. To date, trimethylaluminum (TM...
Atomic layer deposition (ALD) is a method for thin-film growth with atomic thickness control, with m...
Alumina (Al2O3), a suitable replacement for silica (SiO2) as gate oxide in metal oxide semiconductor...
Plasma-enhanced atomic layer deposition (ALD) of metal oxides is a rapidly gaining interest especial...
The surface chemical activity of an alumina films grown on Mo(100) by oxidation of aluminum evaporat...
The interactions of Al, O, and O2 with different α- Al2O3 (0001) surfaces have been studied using ab...
A method to obtain full mass over charge (m/z), time-resolved quadruple mass spectrometry (QMS) spec...