This paper proposes a novel paradigm to generate a parameterized model of the response of linear circuits with the inclusion of worst case bounds. The methodology leverages the so-called Taylor models and represents parameter-dependent responses in terms of a multivariate Taylor polynomial, in conjunction with an interval remainder accounting for the approximation error. The Taylor model representation is propagated from input parameters to circuit responses through a suitable redefinition of the basic operations, such as addition, multiplication or matrix inversion, that are involved in the circuit solution. Specifically, the remainder is propagated in a conservative way based on the theory of interval analysis. While the polynomial part p...
Reliable methods for the analysis of tolerance-affected analog circuits are of great importance in n...
In this paper, we adopt the so-called sparse polynomial chaos metamodel for the uncertainty quantifi...
Electromagnetic compatibility (EMC) investigations often involve the assessment of whether signal in...
This paper proposes a novel paradigm to generate a parameterized model of the response of linear cir...
This paper proposes a novel paradigm to generate a parameterized model of the response of linear cir...
This paper outlines a preliminary application of Taylor models to the worst-case analysis of transmi...
The ever-increasing impact of uncertainties in electronic circuits and systems is requiring the deve...
The ever-increasing impact of uncertainties in electronic circuits and systems is requiring the deve...
This paper presents a general purpose, algebraic tool—named TMsim—for the combined parametric and wo...
This paper proposes to generate a smart tool that can inherently and effectively capture the results...
This paper presents a novel approach to predict the bounds of the time-domain response of a linear s...
A worst case robust design approach based on a suitable application of interval arithmetic (IA) is p...
This paper addresses the simulation of the effects on a high-speed data link of external factors due...
Integrated circuits have to be robust to manufacturing variations. This paper presents a new statist...
International audienceIn modern electronic products, the printed circuit board (PCB) traces may well...
Reliable methods for the analysis of tolerance-affected analog circuits are of great importance in n...
In this paper, we adopt the so-called sparse polynomial chaos metamodel for the uncertainty quantifi...
Electromagnetic compatibility (EMC) investigations often involve the assessment of whether signal in...
This paper proposes a novel paradigm to generate a parameterized model of the response of linear cir...
This paper proposes a novel paradigm to generate a parameterized model of the response of linear cir...
This paper outlines a preliminary application of Taylor models to the worst-case analysis of transmi...
The ever-increasing impact of uncertainties in electronic circuits and systems is requiring the deve...
The ever-increasing impact of uncertainties in electronic circuits and systems is requiring the deve...
This paper presents a general purpose, algebraic tool—named TMsim—for the combined parametric and wo...
This paper proposes to generate a smart tool that can inherently and effectively capture the results...
This paper presents a novel approach to predict the bounds of the time-domain response of a linear s...
A worst case robust design approach based on a suitable application of interval arithmetic (IA) is p...
This paper addresses the simulation of the effects on a high-speed data link of external factors due...
Integrated circuits have to be robust to manufacturing variations. This paper presents a new statist...
International audienceIn modern electronic products, the printed circuit board (PCB) traces may well...
Reliable methods for the analysis of tolerance-affected analog circuits are of great importance in n...
In this paper, we adopt the so-called sparse polynomial chaos metamodel for the uncertainty quantifi...
Electromagnetic compatibility (EMC) investigations often involve the assessment of whether signal in...