To understand the film growth during magnetron sputter deposition a detailed knowledge of the flux of sputtered species from the target towards the substrate is vital. One important parameter is the angular distribution of the impinging neutral target atoms on the substrate, since it is responsible for, for example, self-shadowing effects. The determination of the angular distribution of the metal flux at an arbitrary point in the deposition chamber is achieved by a pinhole camera, where the information of the angular distribution is converted into a thickness profile. This paper describes the construction of such a pinhole camera which is capable of differential pumping, the determination of the angular distribution for a wide variety of t...
A turntable magnetron sputter system based on cylindrical magnetrons was used to investigate particl...
The roughness of a surface is known to have a strong influence on the sputtering process. Commonly u...
The uniformity of magnetron-sputtered films can be evaluated using an analytical model whose key par...
A Monte Carlo simulation of the metal flux from a small scale rotating cylindrical magnetron is pres...
A Monte Carlo simulation of the metal flux from a small scale rotating cylindrical magnetron is pres...
Over the last ten years, low pressure plasma solutions for materials surface treatment have been rem...
Magnetron sputter deposition is integral in the creation of semiconductor devices like integrated co...
The lack of detailed knowledge of internal process conditions remains a key challenge in magnetron s...
The growing demands on the performance of magnetron sputter sources require the improvement of exist...
We describe here the deposition of thin films using magnetron sputtering at oblique angles. General ...
Simulation tools are used to analyse two VLSI metallization processes. The first example is the use ...
In this work, Cu thin films were experimentally fabricated at different target–substrate distances b...
In recent years the ‵unbalanced′ magnetron sputter source has been shown to be an important advancem...
In recent years the ‵unbalanced′ magnetron sputter source has been shown to be an important advancem...
The roughness of a surface is known to have a strong influence on the sputtering process. Commonly u...
A turntable magnetron sputter system based on cylindrical magnetrons was used to investigate particl...
The roughness of a surface is known to have a strong influence on the sputtering process. Commonly u...
The uniformity of magnetron-sputtered films can be evaluated using an analytical model whose key par...
A Monte Carlo simulation of the metal flux from a small scale rotating cylindrical magnetron is pres...
A Monte Carlo simulation of the metal flux from a small scale rotating cylindrical magnetron is pres...
Over the last ten years, low pressure plasma solutions for materials surface treatment have been rem...
Magnetron sputter deposition is integral in the creation of semiconductor devices like integrated co...
The lack of detailed knowledge of internal process conditions remains a key challenge in magnetron s...
The growing demands on the performance of magnetron sputter sources require the improvement of exist...
We describe here the deposition of thin films using magnetron sputtering at oblique angles. General ...
Simulation tools are used to analyse two VLSI metallization processes. The first example is the use ...
In this work, Cu thin films were experimentally fabricated at different target–substrate distances b...
In recent years the ‵unbalanced′ magnetron sputter source has been shown to be an important advancem...
In recent years the ‵unbalanced′ magnetron sputter source has been shown to be an important advancem...
The roughness of a surface is known to have a strong influence on the sputtering process. Commonly u...
A turntable magnetron sputter system based on cylindrical magnetrons was used to investigate particl...
The roughness of a surface is known to have a strong influence on the sputtering process. Commonly u...
The uniformity of magnetron-sputtered films can be evaluated using an analytical model whose key par...