Add to ORKGContinuous circuit and wire miniaturization increasingly exert more pressure on the computer designers to address the issue of reliable operation in the presence of faults. Virtually all previous microarchitectural studies on processor reliability and yield improvement aim to solve the problem for architectural resources
2014-09-10As CMOS fabrication technology continues to move deeper into nano-scale, circuit’s suscept...
Aggressive technology scaling is leading to large variations in transistor parameters due to process...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Abstract—Continuous circuit and wire miniaturization in-creasingly exert more pressure on the comput...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
As conventional silicon Complementary Metal-Oxide-Semiconductor (CMOS) technology continues to shrin...
The continued increase in microprocessor clock frequency that has come from advancements in fabricat...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
The current trends in technology, fabrication processes, and computing architectures are increasingl...
As the limits of computer technology are pushed into the domains of the very small, the very cheap, ...
Today's computer architectures and semiconductor technologies are facing major challenges making the...
2014-09-10As CMOS fabrication technology continues to move deeper into nano-scale, circuit’s suscept...
Aggressive technology scaling is leading to large variations in transistor parameters due to process...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Abstract—Continuous circuit and wire miniaturization in-creasingly exert more pressure on the comput...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Submitted for publication. Please do not distribute. Although device scaling has been providing stea...
As conventional silicon Complementary Metal-Oxide-Semiconductor (CMOS) technology continues to shrin...
The continued increase in microprocessor clock frequency that has come from advancements in fabricat...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2007.Using this model we introduce...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
The current trends in technology, fabrication processes, and computing architectures are increasingl...
As the limits of computer technology are pushed into the domains of the very small, the very cheap, ...
Today's computer architectures and semiconductor technologies are facing major challenges making the...
2014-09-10As CMOS fabrication technology continues to move deeper into nano-scale, circuit’s suscept...
Aggressive technology scaling is leading to large variations in transistor parameters due to process...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...