Li, XiaomingAs technology scales, VLSI performance has experienced an exponential growth. As feature sizes shrink, however, we will face new challenges such as soft errors (singleevent upsets) to maintain the reliability of circuits. Recent studies have tried to address soft errors with error detection and correction techniques such as error-correcting codes or redundant execution. However, these techniques come at a cost of additional storage or lower performance. We present a different approach to address soft errors. We start from building a quantitative understanding of the error propagation in software and propose a systematic evaluation of the impact of bit flip caused by soft errors on floating-point operations. Furthermore, we intro...
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable com-ponents to s...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
If VLSI RAM densities are to continue to increase, it will undoubtedly be necessary to take the pr...
Decreasing transistor sizes, aggressive power optimization techniques and higher operation frequenci...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Traditionally, fault tolerance researchers have made very strict assumptions about program correctne...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
In this paper is described a software technique allowing the detection of soft errors occurring in p...
Soft errors, also known as Single Event Upsets (SEUs), occur due to the impact of energetic particl...
Abstract—We explore the link between data representation and soft errors in dot products. We present...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
Smaller feature size, higher clock frequency and lower power consumption are of core concerns of tod...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable com-ponents to s...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
If VLSI RAM densities are to continue to increase, it will undoubtedly be necessary to take the pr...
Decreasing transistor sizes, aggressive power optimization techniques and higher operation frequenci...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Traditionally, fault tolerance researchers have made very strict assumptions about program correctne...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
In this paper is described a software technique allowing the detection of soft errors occurring in p...
Soft errors, also known as Single Event Upsets (SEUs), occur due to the impact of energetic particl...
Abstract—We explore the link between data representation and soft errors in dot products. We present...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
Smaller feature size, higher clock frequency and lower power consumption are of core concerns of tod...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable com-ponents to s...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...