In this thesis the ANTICS analogue fault simulation software is described which provides a statistical approach to fault simulation for accurate analogue IC test evaluation. The traditional figure of fault coverage is replaced by the average probability of fault detection. This is later refined by considering the probability of fault occurrence to generate a more realistic, weighted test metric. Two techniques to reduce the fault simulation time are described, both of which show large reductions in simulation time with little loss of accuracy. The final section of the thesis presents an accurate comparison of three test techniques and an evaluation of dynamic supply current monitoring. An increase in fault detection for dynamic supply curre...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
A methodology for locating faults in analog integrated circuits using an analog fault simulator is p...
In this thesis the ANTICS analogue fault simulation software is described which provides a statistic...
In this thesis the ANTICS analogue fault simulation software is described which provides a statistic...
In this thesis the ANTICS analogue fault simulation software is described which provides a statistic...
As size and complexity of Integrated Circuits (ICs) keep increasing, testing those ICs is becoming m...
The paper presents a test stimulus generation and fault simulation methodology for the detection of ...
This report describes an effort to develop a technique for measuring the amount of fault detection c...
This report describes an effort to develop a technique for measuring the amount of fault detection c...
Analog circuits are usually tested by checking if their specifications are satisfied. This methodolo...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
This paper describes an effort to develop a technique for measuring the amount of fault detection co...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
A methodology for locating faults in analog integrated circuits using an analog fault simulator is p...
In this thesis the ANTICS analogue fault simulation software is described which provides a statistic...
In this thesis the ANTICS analogue fault simulation software is described which provides a statistic...
In this thesis the ANTICS analogue fault simulation software is described which provides a statistic...
As size and complexity of Integrated Circuits (ICs) keep increasing, testing those ICs is becoming m...
The paper presents a test stimulus generation and fault simulation methodology for the detection of ...
This report describes an effort to develop a technique for measuring the amount of fault detection c...
This report describes an effort to develop a technique for measuring the amount of fault detection c...
Analog circuits are usually tested by checking if their specifications are satisfied. This methodolo...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
This paper describes an effort to develop a technique for measuring the amount of fault detection co...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
A methodology for locating faults in analog integrated circuits using an analog fault simulator is p...