Laser modulated optical reflectance of thin semiconductor films on glass
- Fotsing, J. L. N.
- Hoffmeyer, M.
- Chotikaprakhan, S.
- Dietzel, D.
- Pelzl, J.
- Bein, Bruno K.
- Cerqueira, M. F.
- Macedo, Francisco
- Ferreira, J. A.
Publication date
January 2003
DOI Publisher
AIP Publishing ISSN
0034-6748 Journal
Review of Scientific Instruments Citation count (estimate)
3Abstract
Semiconductor films, deposited by reactive magnetron sputtering on glass substrates have been analyzed with the help of laser-modulated optical reflectance. The results are discussed with respect to the thermal and charge carrier transport properties. Semiconductor properties have been identified both for micro-crystalline and amorphous film
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