The physical origin of trench formation in Ge/Si (100) islands was discussed using Monte Carlo simulations. The stress evolution as the island grows layer by layer indicted that a trench was most likely being formed halfway during growth. It was found that the primary driving force for this phenomenon was the reduction of the concentrated stress below the edges of the islands. Analysis shows that once the trench is formed subsequent intermixing through it is enhanced and nearly compensates for the stress in the island
Abstract We investigate ordered nucleation of Ge islands on pit-patterned Si(001) using an original ...
In this paper we present an atomic force microscopy and X-ray photoemission spectroscopy study of th...
The morphologies of self-assembled Ge/Si(001) islands with initial Si capping at a temperature of 64...
We discuss the effect of the deposition of a Si cap layer on the composition and morphological prope...
Self assembled silicon/germanium islands grown on silicon at high growth temperatures are investiga...
The shape evolution and the effect of deposition temperature on the strain status of Ge/Si(100) isla...
The shape evolution and the effect of deposition temperature on the strain status of Ge/Si(100) isla...
We investigate the morphological evolution of islands obtained by epitaxial growth of Ge on Si(001)...
The effect of the deposition rate on the size, density, and uniformity of Ge islands grown on Si(100...
In this work self-organized SiGe islands are used as stressors for Si capping layers, which later ac...
The morphological evolution of both pits and SiGe islands on patterned Si(001) substrates is investi...
Evolution of the height distribution of Ge islands during in situ annealing of Ge films on Si(1 0 0)...
The effect of the deposition rate on the size, density, and uniformity of Ge islands grown on Si(100...
We report on recent advances in the understanding of surface processes occurring during growth and ...
We present a method and results based on x-ray scattering capable of resolving the shape and strain...
Abstract We investigate ordered nucleation of Ge islands on pit-patterned Si(001) using an original ...
In this paper we present an atomic force microscopy and X-ray photoemission spectroscopy study of th...
The morphologies of self-assembled Ge/Si(001) islands with initial Si capping at a temperature of 64...
We discuss the effect of the deposition of a Si cap layer on the composition and morphological prope...
Self assembled silicon/germanium islands grown on silicon at high growth temperatures are investiga...
The shape evolution and the effect of deposition temperature on the strain status of Ge/Si(100) isla...
The shape evolution and the effect of deposition temperature on the strain status of Ge/Si(100) isla...
We investigate the morphological evolution of islands obtained by epitaxial growth of Ge on Si(001)...
The effect of the deposition rate on the size, density, and uniformity of Ge islands grown on Si(100...
In this work self-organized SiGe islands are used as stressors for Si capping layers, which later ac...
The morphological evolution of both pits and SiGe islands on patterned Si(001) substrates is investi...
Evolution of the height distribution of Ge islands during in situ annealing of Ge films on Si(1 0 0)...
The effect of the deposition rate on the size, density, and uniformity of Ge islands grown on Si(100...
We report on recent advances in the understanding of surface processes occurring during growth and ...
We present a method and results based on x-ray scattering capable of resolving the shape and strain...
Abstract We investigate ordered nucleation of Ge islands on pit-patterned Si(001) using an original ...
In this paper we present an atomic force microscopy and X-ray photoemission spectroscopy study of th...
The morphologies of self-assembled Ge/Si(001) islands with initial Si capping at a temperature of 64...