Microstructure and interface studies of LaVO 3 / SrVO 3 superlattices

  • Boullay, P.
  • David, A.
  • Sheets, W.
  • Lüders, U.
  • Prellier, W.
  • Tan, H.
  • Verbeeck, J.
  • van Tendeloo, G.
  • Gatel, Christophe
  • Vincze, G.
  • Radi, Z.
Publication date
March 2011
Publisher
American Physical Society (APS)

Abstract

International audienceThe structure and interface characteristics of (LaVO3)6m(SrVO3)m superlattices deposited on a (100)-SrTiO3 substrate were studied using transmission electron microscopy (TEM). Cross-section TEM studies revealed that both LaVO3 (LVO) and SrVO3 (SVO) layers are good single-crystal quality and epitaxially grown with respect to the substrate. It is evidenced that LVO layers are made of two orientational variants of a distorted perovskite compatible with bulk LaVO3, while SVO layers suffers from a tetragonal distortion due to the substrate-induced stain. Electron energy loss spectroscopy investigations indicate changes in the fine structure of the V L23 edge, related to a valence change between the LaVO3 and the SrVO3 layer...

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