The field ion microscope is an instrument that can provide an image of the surface of a metallic sample at the atomic scale. The technique is therefore interest in materials sciences to quantify and characterized the finest crystalline defects. The sample used is a sharp needle carried at a potential of several kilovolts. The image of the surface is obtained by ionization of an image gas under the effect of the electric field at the apex of the tip. Under the effect of this electric field the tip can also be progressively eroded to allow a series of images of the sample at different depths. The objective of this work is to use these images to obtain a 3D reconstruction at the atomic scale of the analyzed sample. The post-processing algorith...
Computer simulation and interpretation of field ion microscopy images of ion irradiated platinum are...
Abstract. The progress made at Cornell University over the past few years in applying the field ion ...
\u3cp\u3eThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic...
The field ion microscope is an instrument that can provide an image of the surface of a metallic sam...
The field ion microscope is an instrument that can provide an image of the surface of a metallic sam...
An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data ...
In this work, new reconstruction and analysis methods were developed for 3D field ion microscopy (FI...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
This article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale th...
This article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale th...
This article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale th...
The methods of investigating metals with the field ion microscope of E. W. Müller are described. Dis...
Computer simulation and interpretation of field ion microscopy images of ion irradiated platinum are...
Abstract. The progress made at Cornell University over the past few years in applying the field ion ...
\u3cp\u3eThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic...
The field ion microscope is an instrument that can provide an image of the surface of a metallic sam...
The field ion microscope is an instrument that can provide an image of the surface of a metallic sam...
An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data ...
In this work, new reconstruction and analysis methods were developed for 3D field ion microscopy (FI...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
International audienceThis article presents a fast and highly efficient algorithm developed to recon...
This article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale th...
This article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale th...
This article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale th...
The methods of investigating metals with the field ion microscope of E. W. Müller are described. Dis...
Computer simulation and interpretation of field ion microscopy images of ion irradiated platinum are...
Abstract. The progress made at Cornell University over the past few years in applying the field ion ...
\u3cp\u3eThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic...