Solder joints are subjected to varied stress cycle circumstances in the electronic packaging service life but are also influenced by aging. There has been limited investigation into the influence of aging and varying cycles on SnAgCu-Bi (SAC-Bi) solder joint fatigue. Cyclic fatigue tests were performed on solder joints of several alloys, including SnAgCu (SAC305), SnAgCu-Bi (SAC-Q), and SnCu-Bi (SAC-R). Individual solder joints were cycled under varying stress levels, alternating between mild and harsh stress levels. At least seven samples were prepared for each alloy by alternating between 25 mild stress (MS) cycles and three harsh stress (HS) cycles until the solder joint broke off. The impact of aging on Bi-doped solder joints fatigue un...
Since the use of the lead was restricted in electronic assemblies, the electronic market turned on l...
Most accelerated temperature cycling (ATC) tests reported the observations that SnAgCu (SAC) solders...
With the recent development of mobile consumer electronics, a unique set of reliability issues those...
Electronic manufacturing is one of the dynamic industries in the world in terms of leading technolog...
The failure of one solder joint out of the hundreds of joints in a system compromises the reliabilit...
The present study evaluates the relative thermal fatigue life of tin-silver-copper (SnAgCu or SAC) l...
Solder joints play a critical role in electronic devices by providing electrical, mechanical and the...
The ever increasing amount of electronic waste, most of which ends up in landfills, has become a ser...
Solder fatigue phenomena on lead-free solder joints have been subject of numerous studies. In most c...
The mechanics of failure in a solder joint under cyclic mechanical loading is quantified and describ...
Solder joints are often the cause of failure in electronic devices, failing due to cyclic creep indu...
Tensile properties and stress-controlled fatigue fracture behaviors of Cu/Sn-4Ag solder joints aged ...
In electronic assemblies, solder joints are used to create electrical connections, remove heat, and ...
While the fatigue behaviours (including fatigue life predictions) of lead-free solder joints have be...
The fatigue of Sn–37 wt.% Pb model solder joints has been investigated under thermomechanical and th...
Since the use of the lead was restricted in electronic assemblies, the electronic market turned on l...
Most accelerated temperature cycling (ATC) tests reported the observations that SnAgCu (SAC) solders...
With the recent development of mobile consumer electronics, a unique set of reliability issues those...
Electronic manufacturing is one of the dynamic industries in the world in terms of leading technolog...
The failure of one solder joint out of the hundreds of joints in a system compromises the reliabilit...
The present study evaluates the relative thermal fatigue life of tin-silver-copper (SnAgCu or SAC) l...
Solder joints play a critical role in electronic devices by providing electrical, mechanical and the...
The ever increasing amount of electronic waste, most of which ends up in landfills, has become a ser...
Solder fatigue phenomena on lead-free solder joints have been subject of numerous studies. In most c...
The mechanics of failure in a solder joint under cyclic mechanical loading is quantified and describ...
Solder joints are often the cause of failure in electronic devices, failing due to cyclic creep indu...
Tensile properties and stress-controlled fatigue fracture behaviors of Cu/Sn-4Ag solder joints aged ...
In electronic assemblies, solder joints are used to create electrical connections, remove heat, and ...
While the fatigue behaviours (including fatigue life predictions) of lead-free solder joints have be...
The fatigue of Sn–37 wt.% Pb model solder joints has been investigated under thermomechanical and th...
Since the use of the lead was restricted in electronic assemblies, the electronic market turned on l...
Most accelerated temperature cycling (ATC) tests reported the observations that SnAgCu (SAC) solders...
With the recent development of mobile consumer electronics, a unique set of reliability issues those...