A flexible BIST strategy for SDR transmitters

International audienceSoftware-defined radio (SDR) development aims for increased speed and flexibility. The advent of these system level requirements on the physical layer (PHY) access hardware is leading to more complex architectures, which together with higher levels of integration pose a challenging problem for product testing. For radio units that must be field-upgradeable without specialized equipment, Built-in Self-Test (BIST) schemes are arguably the only way to ensure continued compliance to specifications. In this paper we introduce a loopback RF BIST technique that uses Periodically Nonuniform Sampling (PNS2) of the transmitter (TX) output to evaluate compliance to spectral mask specifications. No significant hardware costs are incurred due to the re-use of available RX resources (I/Q ADCs, DSP, GPP, etc.). Simulation results of an homodyne TX demonstrate that Adjacent Channel Power Ratio (ACPR) can be accurately estimated. Future work will consist in validating our loopback RF BIST architecture on an in-house SDR testbed