The identification of the most suited BIST architecture is one of the bottlenecks in the actual application of self-testing techniques. The aim of this paper is the investigation of possible relations between the behavioral level specification of the circuit, and the structural level, where BIST logic is inserted. We propose to use behavioral test patterns to guide the selection of the most appropriate BIST architecture with respect to the given application as a trade-off between fault coverage and area overhead. The correlation between the behavioral analysis and the actual fault coverage of the inserted BIST logic has been shown on a number of benchmarks
118 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.The dissertation investigates...
A method for testing embedded core based system chips is to use a built-in-self-test (BIST). A mixed...
118 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.The dissertation investigates...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
BIST techniques have been widely explored to create the best performing self-testing architecture. T...
Built In Self Test (BIST) has emerged as a promising solution for increasingly fast and dense VLSI c...
website : http://msrc.wvu.edu/JMSI/vol1.htmlInternational audienceIn this paper, we present what is ...
With higher computerization in the automobile stream, the built-in self-test is essential for high q...
Multiple test patterns varying in a single bit position is generated for built-in-self-test (BIST). ...
A Built-in self-test technique constitute a class of algorithms that provide the capability of perfo...
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in eac...
Built-in self-test techniques have been widely researched and adopted for reasons of improvements in...
118 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.The dissertation investigates...
A method for testing embedded core based system chips is to use a built-in-self-test (BIST). A mixed...
118 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.The dissertation investigates...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
The identification of the most suited BIST architecture is one of the bottlenecks in the actual appl...
BIST techniques have been widely explored to create the best performing self-testing architecture. T...
Built In Self Test (BIST) has emerged as a promising solution for increasingly fast and dense VLSI c...
website : http://msrc.wvu.edu/JMSI/vol1.htmlInternational audienceIn this paper, we present what is ...
With higher computerization in the automobile stream, the built-in self-test is essential for high q...
Multiple test patterns varying in a single bit position is generated for built-in-self-test (BIST). ...
A Built-in self-test technique constitute a class of algorithms that provide the capability of perfo...
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in eac...
Built-in self-test techniques have been widely researched and adopted for reasons of improvements in...
118 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.The dissertation investigates...
A method for testing embedded core based system chips is to use a built-in-self-test (BIST). A mixed...
118 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.The dissertation investigates...