Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a sample at the atomic scale. Techniques such as non-contact atomic force microscopy (NC-AFM), allows us to to characterize the forces present on a surface, resolve the atomic structure of molecules or examine their chemical properties, while scanning tunneling microscopy (STM) allows their electronic properties to be characterized. As the interactions take place at the atomic scale, the atomistic state of the probe apex plays a crucial role. In AFM, it is the atomic scale forces between the outermost atoms of the probe and surface that are dominant, while for STM the density of states (DOS) that contribute to tunneling are crucial. Therefore...
The effect of tip chemical reactivity on the lateral manipulation of intrinsic Si adatoms toward a v...
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of single atoms and molecules ...
It has been shown that electron transitions, as measured in a scanning tunnelling microscope, are re...
Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a...
Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a...
Adopting the empirical silicon interatomic potential of Stillinger and Weber, we investigate the eff...
Tip-induced modifications of microscopic processes in scanning tunneling microscopy (STM) and atomic...
The scan probe microscopy (SPM), a technology based on the scan tunneling microscope (STM), the atom...
The atomic-scale contrast in noncontact atomic force microscopy (nc-AFM) images is determined by the...
The scan probe microscopy (SPM), a technology based on the scan tunneling microscope (STM), the atom...
Non-contact atomic force microscopy allows us to directly probe the interactions between atoms and m...
The short range force between the tip and the surface atoms, that is responsible for atomic-scale co...
Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution ima...
Manipulation of individual atoms and molecules by scanning probe microscopy offers the ability of co...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
The effect of tip chemical reactivity on the lateral manipulation of intrinsic Si adatoms toward a v...
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of single atoms and molecules ...
It has been shown that electron transitions, as measured in a scanning tunnelling microscope, are re...
Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a...
Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a...
Adopting the empirical silicon interatomic potential of Stillinger and Weber, we investigate the eff...
Tip-induced modifications of microscopic processes in scanning tunneling microscopy (STM) and atomic...
The scan probe microscopy (SPM), a technology based on the scan tunneling microscope (STM), the atom...
The atomic-scale contrast in noncontact atomic force microscopy (nc-AFM) images is determined by the...
The scan probe microscopy (SPM), a technology based on the scan tunneling microscope (STM), the atom...
Non-contact atomic force microscopy allows us to directly probe the interactions between atoms and m...
The short range force between the tip and the surface atoms, that is responsible for atomic-scale co...
Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution ima...
Manipulation of individual atoms and molecules by scanning probe microscopy offers the ability of co...
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide ...
The effect of tip chemical reactivity on the lateral manipulation of intrinsic Si adatoms toward a v...
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of single atoms and molecules ...
It has been shown that electron transitions, as measured in a scanning tunnelling microscope, are re...