International audienceThis paper studies the statistical inference in a degradation model with imperfect maintenance. Technological or industrial devices subject to degradation undergo maintenance actions that reduce their degradation level. The underlying degradation process is a Wiener process with drift. Maintenance effects are assumed to be imperfect, described by an Arithmetic Reduction of Degradation (ARD 1) model. The system is regularly inspected and the degradation levels are measured. Four different observation schemes are considered so that degradation levels can be observed between maintenance actions as well as just before or just after maintenance times. The paper studies the estimation of the model parameters under the four o...
Current degradation modeling and remaining useful life prediction studies share a common assumption ...
As the key part of Prognostics and Health Management (PHM), Remaining Useful Life (RUL) estimation h...
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime d...
International audienceThis paper studies the statistical inference in a degradation model with imper...
International audienceIn this article, technological or industrial equipment that are subject to deg...
National audienceIn this article, we consider technological or industrial equipments that are subjec...
International audienceIn this paper, a gradually deteriorating system with imperfect repair is consi...
The stationaryWiener process is widely used in modeling degradation processes, mainly due to the exi...
Degradation is a common phenomenon for many products. Because of a variety of reasons, the degradati...
This paper presents a maintenance optimization framework for systems suffering from nonlinear contin...
Degradation trajectories over time provide information that is important for the life estimation of ...
AbstractThis article studies the maximum likelihood inference on a class of Wiener processes with ra...
There has been considerable interest in quality and reliability improvement methods among researcher...
International audienceThe paper considers complex industrial systems with incomplete maintenance his...
The time–history of the performance of a system is treated as a stochastic corrective process, in wh...
Current degradation modeling and remaining useful life prediction studies share a common assumption ...
As the key part of Prognostics and Health Management (PHM), Remaining Useful Life (RUL) estimation h...
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime d...
International audienceThis paper studies the statistical inference in a degradation model with imper...
International audienceIn this article, technological or industrial equipment that are subject to deg...
National audienceIn this article, we consider technological or industrial equipments that are subjec...
International audienceIn this paper, a gradually deteriorating system with imperfect repair is consi...
The stationaryWiener process is widely used in modeling degradation processes, mainly due to the exi...
Degradation is a common phenomenon for many products. Because of a variety of reasons, the degradati...
This paper presents a maintenance optimization framework for systems suffering from nonlinear contin...
Degradation trajectories over time provide information that is important for the life estimation of ...
AbstractThis article studies the maximum likelihood inference on a class of Wiener processes with ra...
There has been considerable interest in quality and reliability improvement methods among researcher...
International audienceThe paper considers complex industrial systems with incomplete maintenance his...
The time–history of the performance of a system is treated as a stochastic corrective process, in wh...
Current degradation modeling and remaining useful life prediction studies share a common assumption ...
As the key part of Prognostics and Health Management (PHM), Remaining Useful Life (RUL) estimation h...
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime d...