Add to ORKGNew Design for Testability techniques aimed both at overcoming the problem of testing array architectures composed of sequential cells and at guaranteeing fault tolerance through reconfiguration are proposed
The testability problem of dual-port memories is investigated. A functional model is defined, and ar...
Reversible logic design is a well-known paradigm in digital computation. In this paper, Quantum-dot ...
The testability problem of dual-port memories is investigated. A functional model is defined, and ar...
New Design for Testability techniques aimed both at overcoming the problem of testing array architec...
New design for testability techniques aiming at overcoming the problem of testing array architecture...
Testing of array architectures is an important issue because of the relevance that these structures ...
AbstractThe test methods of two-dimensional (2-D) iterative logic arrays (ILAs) composed of combinat...
Graduation date: 1979With the advent of LSI, iterative forms of realization\ud of digital systems ar...
Testability analysis can be performed through classification of all possible simple interconnection ...
[[abstract]]Design-for-testability techniques and built-in self-test structures are presented for ce...
113 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1985.The test methods of general i...
Abstract:- In today’s nanometer technology era, more sophicated defect mechanisms might exist in the...
This correspondence presents a new testing method for single instruction multiple data (SIMD) VLSI a...
The testability problem of dual-port memories is investigated. A functional model is defined, and ar...
Reversible logic design is a well-known paradigm in digital computation. In this paper, Quantum-dot ...
The testability problem of dual-port memories is investigated. A functional model is defined, and ar...
New Design for Testability techniques aimed both at overcoming the problem of testing array architec...
New design for testability techniques aiming at overcoming the problem of testing array architecture...
Testing of array architectures is an important issue because of the relevance that these structures ...
AbstractThe test methods of two-dimensional (2-D) iterative logic arrays (ILAs) composed of combinat...
Graduation date: 1979With the advent of LSI, iterative forms of realization\ud of digital systems ar...
Testability analysis can be performed through classification of all possible simple interconnection ...
[[abstract]]Design-for-testability techniques and built-in self-test structures are presented for ce...
113 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1985.The test methods of general i...
Abstract:- In today’s nanometer technology era, more sophicated defect mechanisms might exist in the...
This correspondence presents a new testing method for single instruction multiple data (SIMD) VLSI a...
The testability problem of dual-port memories is investigated. A functional model is defined, and ar...
Reversible logic design is a well-known paradigm in digital computation. In this paper, Quantum-dot ...
The testability problem of dual-port memories is investigated. A functional model is defined, and ar...