Add to ORKGIn this contribution we experimentally investigate backscattering and polarization rotation induced by sidewall roughness in silicon-on-insulator (SOI) optical waveguides. Waveguides with different widths, different upper cladding and longitudinally tapered have been measured and compared. All the measurements have been performed by means of an advanced frequency domain interferometric technique, which allows the evaluation of both amplitude and phase of backscatter as well as its polarization
We present an analysis of the polarisation dependent scattering loss due to surface and sidewall rou...
We show that stress engineering can be used to adjust the SOI waveguide birefringence to the stringe...
The interface between the core and the cladding of optical waveguides is a critical surface where a ...
In this contribution we experimentally investigate backscattering and polarization rotation induced ...
We report on the direct observation of backscattering induced by sidewall roughness in high-index-co...
The effects of roughness induced backscattering in optical waveguides and circuit realized on a sili...
The properties and the statistics of backscattering induced by sidewall roughness in optical wavegui...
We investigate the eects of backscattering induced by waveguide sidewall roughness in high-index con...
The statistics of backscattering induced by sidewall roughness in dielectric optical waveguides is e...
The effects of backscattering induced by waveguide sidewall roughness in integrated ring resonators ...
Sidewall roughness in optical waveguides represents a severe impairment for the proper functionality...
We present an analysis of the polarisation dependent scattering loss due to surface and sidewall rou...
We show that stress engineering can be used to adjust the SOI waveguide birefringence to the stringe...
The interface between the core and the cladding of optical waveguides is a critical surface where a ...
In this contribution we experimentally investigate backscattering and polarization rotation induced ...
We report on the direct observation of backscattering induced by sidewall roughness in high-index-co...
The effects of roughness induced backscattering in optical waveguides and circuit realized on a sili...
The properties and the statistics of backscattering induced by sidewall roughness in optical wavegui...
We investigate the eects of backscattering induced by waveguide sidewall roughness in high-index con...
The statistics of backscattering induced by sidewall roughness in dielectric optical waveguides is e...
The effects of backscattering induced by waveguide sidewall roughness in integrated ring resonators ...
Sidewall roughness in optical waveguides represents a severe impairment for the proper functionality...
We present an analysis of the polarisation dependent scattering loss due to surface and sidewall rou...
We show that stress engineering can be used to adjust the SOI waveguide birefringence to the stringe...
The interface between the core and the cladding of optical waveguides is a critical surface where a ...