Capacitive effects and memristive switching in three terminal multilayered MoS<inf>2</inf>devices

We report on the electrical properties of gated two-terminal multilayered molybdenum disulfide (MoS2) memristor devices having a planar architecture. The approach based on highly dispersed MoS2 flakes drop cast onto a bottom gated Si/SiO2 (100nm) wafer containing metal Pd contact electrodes yields devices that exhibit a number of complex properties including memristive and capacitive effects as well as multiple non-zero-crossing current-voltage hysteresis effects. The devices also show a reaction to a varying gate bias. An increasingly positive gate led to the devices displaying a linear ohmic I-V response while an increasingly negative gate bias drove the system to behave more memristive with a widening hysteresis loop