Fault modeling is a fundamental element for several activities, ranging from off- and on-line testing, to fault tolerance and dependability-aware design. These activities are carried out during various design phases, dealing with specifications at different abstraction levels. Therefore, modeling faults across abstraction levels is of paramount importance to introduce dependability-related issues from the early phases of design. This paper analyzes how faults can be modeled at the different levels of abstraction with respect to Transaction Level Models, and how these models are related across levels. The work focuses on soft errors and aims at providing support to dependability analysis. A case study of a Transaction Level specification of ...
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tou...
The early fault analysis is mandatory for safety critical systems, which are required to operate saf...
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tou...
Fault modeling is a fundamental element for several activities, ranging from off- and on-line testin...
Due to their increasing complexity, today\u27s SoC (system on chip) systems are subject to a variety...
This chapter discusses dependability threads for modern integrated circuits that affect both their c...
* Process Algebras are a suitable formalism both for system-level description and for ATPG with for...
Abstract—In recent technology nodes, reliability is considered a part of the standard design flow at...
Test of electronic circuits for fabrication fault is important if the circuits should have reasonabl...
Safety-critical applications are now common where both digital and mechanical components are deploye...
International audienceA fault simulation and test-pattern-generation environment is specified. It in...
We perform a case study on the interrelations between problem specifications in ideal environments a...
[[abstract]]The relationship between faults in a synthesized multilevel network and in its collapsed...
Dependability is a qualitative term referring to a system's ability to meet its service requirements...
ISBN: 0769522416Fault injection techniques are increasingly used when designing a circuit, in order ...
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tou...
The early fault analysis is mandatory for safety critical systems, which are required to operate saf...
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tou...
Fault modeling is a fundamental element for several activities, ranging from off- and on-line testin...
Due to their increasing complexity, today\u27s SoC (system on chip) systems are subject to a variety...
This chapter discusses dependability threads for modern integrated circuits that affect both their c...
* Process Algebras are a suitable formalism both for system-level description and for ATPG with for...
Abstract—In recent technology nodes, reliability is considered a part of the standard design flow at...
Test of electronic circuits for fabrication fault is important if the circuits should have reasonabl...
Safety-critical applications are now common where both digital and mechanical components are deploye...
International audienceA fault simulation and test-pattern-generation environment is specified. It in...
We perform a case study on the interrelations between problem specifications in ideal environments a...
[[abstract]]The relationship between faults in a synthesized multilevel network and in its collapsed...
Dependability is a qualitative term referring to a system's ability to meet its service requirements...
ISBN: 0769522416Fault injection techniques are increasingly used when designing a circuit, in order ...
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tou...
The early fault analysis is mandatory for safety critical systems, which are required to operate saf...
As the complexity of Very Large Scale Integration (VLSI) is growing, testing becomes tedious and tou...