A 0.0012 mm² 6-bit 700 MS/s 1 mW Calibration-Free Pseudo-Loop-Unrolled SAR ADC in 28 nm CMOS

This paper presents a high-speed successive approximation register (SAR) analog-to-digital converter (ADC) that takes advantage of both asynchronous SAR ADC and loop-unrolled (LU) SAR ADC. By utilizing the output of the dynamic amplifier (DA) to generate an asynchronous clock, the reset time for the DA can be hidden behind the comparator latching time. Dedicated latches for each digital-to-analog converter (DAC) element eliminate the need for DAC switching logic. The proposed inverter-inserted three-stage comparator significantly reduces the input-referred offset of the comparator. The prototype 6-bit 700 MS/s SAR ADC was implemented in a 28 nm CMOS process and has a small 0.0012 mm2 area. The measured peak DNL and INL without any mismatch calibration were 0.33 and 0.27 LSB, respectively. With Nyquist input, the measured signal-to-noise and distortion ratio (SNDR) and spurious-free dynamic range (SFDR) were 34.07 and 47.52 dB, respectively. The power consumption was 1 mW under a supply voltage of 1.0 V, leading to a Walden figure of merit (FoM) of 34.6 fJ/conversion-step at 700 MS/s