In this work, a deep representation learning method is proposed to build continuous-valued representations of individual integrated circuit (IC) devices. These representations are used to render mixed-variable analog circuit sizing problems as continuous ones and to apply a low-budget black box Bayesian optimization (BO) variant to solve them. By transforming the initial search spaces into continuous-valued ones, the BO’s Gaussian process models (GPs), which typically operate on real-valued spaces, can be used to guide the optimization search towards the global optimum. The proposed Device Representation Learning approach involves using device simulation data and training a composite model of a Variational Autoencoder (VAE) and a dense Neur...
Analog IC design is characterized by non-systematic re-design iterations, often requiring partial or...
This paper investigates a hybrid evolutionary-based design system for automated sizing of analog int...
Published version of an article in the journal: Mathematical Problems in Engineering. Also available...
This paper presents a machine learning powered, procedural sizing methodology based on pre-computed ...
Analog circuit sizing takes a significant amount of manual effort in a typical design cycle. With ra...
This book applies to the scientific area of electronic design automation (EDA) and addresses the aut...
The traditional iterative design flows for analog integrated circuit synthesis, which can help meet ...
This paper presents an algorithm, based on the fixed point iteration, to solve for sizes and biases ...
There is still a great reliance on human expert knowledge during the analog integrated circuit sizin...
© 2020 IEEE. Automatic transistor sizing is a challenging problem in circuit design due to the large...
This article introduces an evolution-based methodology, named memetic single-objective evolutionary ...
Abstract—This paper presents SANGRIA, a tool for automated globally reliable variation-aware sizing ...
This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizi...
This article introduces an evolution-based methodology, named memetic single-objective evolutionary ...
The analog circuit sizing can be viewed as a constrained optimization problem. Evolutionary algorith...
Analog IC design is characterized by non-systematic re-design iterations, often requiring partial or...
This paper investigates a hybrid evolutionary-based design system for automated sizing of analog int...
Published version of an article in the journal: Mathematical Problems in Engineering. Also available...
This paper presents a machine learning powered, procedural sizing methodology based on pre-computed ...
Analog circuit sizing takes a significant amount of manual effort in a typical design cycle. With ra...
This book applies to the scientific area of electronic design automation (EDA) and addresses the aut...
The traditional iterative design flows for analog integrated circuit synthesis, which can help meet ...
This paper presents an algorithm, based on the fixed point iteration, to solve for sizes and biases ...
There is still a great reliance on human expert knowledge during the analog integrated circuit sizin...
© 2020 IEEE. Automatic transistor sizing is a challenging problem in circuit design due to the large...
This article introduces an evolution-based methodology, named memetic single-objective evolutionary ...
Abstract—This paper presents SANGRIA, a tool for automated globally reliable variation-aware sizing ...
This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizi...
This article introduces an evolution-based methodology, named memetic single-objective evolutionary ...
The analog circuit sizing can be viewed as a constrained optimization problem. Evolutionary algorith...
Analog IC design is characterized by non-systematic re-design iterations, often requiring partial or...
This paper investigates a hybrid evolutionary-based design system for automated sizing of analog int...
Published version of an article in the journal: Mathematical Problems in Engineering. Also available...