Data transmission in advanced space communications are suffering with the different types of noises. Further, these noises causeburst errors indata. Thus, the error correction codes (ECC) plays the major role to detect and correct the errors. However, the conventional hamming encoders, decoderswere detected and corrected only one bit error. Therefore, this work implementation the Multi-Bit Error Detection and CorrectionCodes (MBE-DCC) for multiple bits error detection and correction. Initially, MBE-DCC encoding operation is implemented by using generator matrix, which contains both identity bits and parity bits. Then, encoded code word is transmitted into the channel of space communication, where encoded data corrupted by different types of...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Data transmission in advanced space communications are suffering with the different types of noises....
© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for a...
© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for a...
© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for a...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
An important issue in the reliability of memories exposed to radiation environment is transient mult...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Abstract — Nowadays, memories we use are cheap, easily available in market, compact, have high progr...
A brief overview of a processing satellite for a mesh very-small-aperture (VSAT) communications netw...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
Abstract: Now-a-days, the memory devices are susceptible to Single Event Upsets (SEU) which is one o...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Data transmission in advanced space communications are suffering with the different types of noises....
© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for a...
© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for a...
© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for a...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
An important issue in the reliability of memories exposed to radiation environment is transient mult...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
Abstract — Nowadays, memories we use are cheap, easily available in market, compact, have high progr...
A brief overview of a processing satellite for a mesh very-small-aperture (VSAT) communications netw...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
As memory technology scales, the demand for higher performance and reliable operation is increasing ...
Abstract: Now-a-days, the memory devices are susceptible to Single Event Upsets (SEU) which is one o...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...
Multiple Cell Upsets (MCUs) are becoming a serious threat to memory reliability. Different types of ...