LOW-NOISE AUTOMATED MEASUREMENT SYSTEM FOR LOW-FREQUENCY CURRENT FLUCTUATIONS IN THIN-OXIDE SILICON STRUCTURES

SALETTI R
NERI B

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Publication date

January 1992

DOI

10.1109/19.126645

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

ISSN

0018-9456

Abstract

This paper describes the design of an automated system for low-noise measurement of low-frequency current fluctuations in thin-oxide silicon devices. The aim of these measurements is to study the current tunneling through the oxide, and to investigate its correlation with the oxide breakdown. The dedicated system is realized by integrating a personal computer commercial acquisition board with custom designed low-noise preamplifiers

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LOW-NOISE AUTOMATED MEASUREMENT SYSTEM FOR LOW-FREQUENCY CURRENT FLUCTUATIONS IN THIN-OXIDE SILICON STRUCTURES

Abstract

Extracted data

LOW-NOISE AUTOMATED MEASUREMENT SYSTEM FOR LOW-FREQUENCY CURRENT FLUCTUATIONS IN THIN-OXIDE SILICON STRUCTURES

Abstract

Extracted data

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